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    Test system and method for signal processing
    1.
    发明授权
    Test system and method for signal processing 有权

    公开(公告)号：US11536764B2

    公开(公告)日：2022-12-27

    申请号：US16929968

    申请日：2020-07-15

    Applicant: Rohde & Schwarz GmbH & Co. KG

    Inventor： Kevin Guo ,  Johann Tost

    IPC: G01R31/28 ,  H04B17/00

    Abstract: The invention relates to a test system, comprising: a test instrument, wherein the test instrument comprises an input port configured to acquire a test signal, a display configured to display a graphical representation of the test signal, and an application interface configured to forward the test signal. The test system further comprises a test application module, which is configured to receive the forwarded test signal from the application interface, wherein the test application module comprises a processing unit configured to further process the received test signal, and an instrument interface configured to forward a result of the further processing back to the test instrument and/or to a further device.

    MEASUREMENT APPLICATION PROBE, MEASUREMENT APPLICATION DEVICE, AND MEASUREMENT APPLICATION SYSTEM
    3.
    发明申请
    MEASUREMENT APPLICATION PROBE, MEASUREMENT APPLICATION DEVICE, AND MEASUREMENT APPLICATION SYSTEM 有权

    公开(公告)号：US20250038466A1

    公开(公告)日：2025-01-30

    申请号：US18360276

    申请日：2023-07-27

    Applicant: Rohde & Schwarz GmbH & Co. KG

    Inventor： Hongjin Kim ,  Kevin Guo

    IPC: H01R31/06 ,  G07C5/08 ,  H01R13/70

    Abstract: The present disclosure provides a measurement application system comprising a measurement application probe comprising an automotive connector configured to couple to an in-vehicle connector, and at least one measurement application device connector, and the measurement application system further comprising a measurement application device comprising at least one measurement interface coupled to a respective measurement application device connector of the measurement application probe, and configured to receive a measurement signal from the measurement application probe, and a protocol decoder coupled to the measurement interface, and configured to decode the received at least one measurement signal according to a predefined communication protocol. In addition, the present disclosure provides a measurement application probe, and a measurement application device.

    Use of Configurable Phase Range to Detect DDR Read and Write Bursts
    4.
    发明公开
    Use of Configurable Phase Range to Detect DDR Read and Write Bursts 审中-公开

    公开(公告)号：US20240347121A1

    公开(公告)日：2024-10-17

    申请号：US18298467

    申请日：2023-04-11

    Applicant: Rohde & Schwarz GmbH & Co. KG

    Inventor： Kevin Guo ,  Hong Jin Kim

    IPC: G11C29/10

    CPC classification number: G11C29/10

    Abstract: A method (and corresponding system, computer program and storage device) for testing a device under test, DUT, comprising: generating or receiving, by a component of the DUT, a bus signal, wherein the bus signal comprises a first data signal having a plurality of first phase angles or a second data signal having a plurality of second phase angles; averaging the phase angles for a predetermined bus signal length; comparing the averaged phase angle with a preset phase range; and identifying the first data signal or the second data signal in the bus signal based on the comparison.

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