SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE

    公开(公告)号:US20240175922A1

    公开(公告)日:2024-05-30

    申请号:US18272432

    申请日:2022-01-12

    申请人: Rohm Co., Ltd.

    摘要: A self-diagnosis circuit (BST1) configured to diagnose a fault detection circuit (20) including a first comparator (CMP1) configured to be fed with a voltage based on a fault sensing target voltage (Vo1) and a first reference voltage (Vref1) includes a voltage switch circuit (50) configured to switch the level of a voltage based on a second reference voltage (Vref2) and output the resulting voltage, a first path switch circuit (51) configured to switch between a path through which the voltage output from the voltage switch circuit is fed to the first comparator and a path through which the voltage based on the fault sensing target voltage is fed to the first comparator, and a control circuit (15) configured to control the voltage switch circuit and the path switch circuit.