Apparatus, system, and method for detecting cracking within an aftertreatment device
    7.
    发明授权
    Apparatus, system, and method for detecting cracking within an aftertreatment device 有权
    用于检测后处理装置中的裂纹的装置,系统和方法

    公开(公告)号:US07701231B2

    公开(公告)日:2010-04-20

    申请号:US11688697

    申请日:2007-03-20

    IPC分类号: G01R27/08 G01R31/08

    CPC分类号: B01D46/0086 B01D2273/18

    摘要: An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.

    摘要翻译: 公开了用于检测颗粒过滤器中的裂纹的装置,系统和方法。 该方法可以包括提供一种包括具有基板和基板表面的后处理装置的装置,形成结合到基板表面的导电路径的导电材料以及被配置为允许传导路径的电阻测量的接入点。 该方法可以包括测量导电路径的电阻,并且基于电阻测量来确定衬底表面上是否发生了一个或多个裂纹。 该方法可以进一步包括基于指定的裂纹量标记后处理装置的劣化水平,并且在服务事件之后,基于劣化水平,用等效的后处理装置替换后处理装置。

    APPARATUS, SYSTEM, AND METHOD FOR DETECTING CRACKING WITHIN AN AFTERTREATMENT DEVICE
    9.
    发明申请
    APPARATUS, SYSTEM, AND METHOD FOR DETECTING CRACKING WITHIN AN AFTERTREATMENT DEVICE 有权
    用于在后处理装置中检测裂纹的装置,系统和方法

    公开(公告)号:US20090108856A1

    公开(公告)日:2009-04-30

    申请号:US11688697

    申请日:2007-03-20

    IPC分类号: G01R27/08

    CPC分类号: B01D46/0086 B01D2273/18

    摘要: An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.

    摘要翻译: 公开了用于检测颗粒过滤器中的裂纹的装置,系统和方法。 该方法可以包括提供一种包括具有基板和基板表面的后处理装置的装置,形成结合到基板表面的导电路径的导电材料以及被配置为允许传导路径的电阻测量的接入点。 该方法可以包括测量导电路径的电阻,并且基于电阻测量来确定衬底表面上是否发生了一个或多个裂纹。 该方法可以进一步包括基于指定的裂纹量标记后处理装置的劣化水平,并且在服务事件之后,基于劣化水平,用等效的后处理装置替换后处理装置。