System and method for cooling a semiconductor light source bar during burn-in testing
    1.
    发明授权
    System and method for cooling a semiconductor light source bar during burn-in testing 有权
    在老化测试期间冷却半导体光源棒的系统和方法

    公开(公告)号:US08503493B1

    公开(公告)日:2013-08-06

    申请号:US13525648

    申请日:2012-06-18

    IPC分类号: H01S3/04 H01S5/00

    摘要: A system for cooling a semiconductor light source bar during burn-in testing includes a fixture for holding the semiconductor light source bar, and the fixture including a housing having a water inlet channel and a water outlet channel communicated with the water inlet channel; a first water tank with coolant connected with the water inlet channel; a second water tank connected with the water outlet channel; and a pumping device at least connected with the water outlet channel for pumping the coolant from the first water tank to the second water tank, thereby rushing a bottom of the semiconductor light source bar to lower the temperature thereof. The system can disperse the local heat generated during burn-in testing and uniform the local temperature of the semiconductor light source bar, thereby maintaining a proper temperature during burn-in testing and improving the heat stability of the heat assist magnetic recording head.

    摘要翻译: 用于在老化测试期间冷却半导体光源棒的系统包括用于保持半导体光源棒的固定装置,该固定装置包括具有与进水通道连通的进水通道和出水通道的壳体; 第一个与进水通道连接的冷却水箱; 与出水通道连接的第二水箱; 以及泵送装置,其至少与出水通道连接,用于将冷却剂从第一水箱泵送到第二水箱,从而冲洗半导体光源棒的底部以降低其温度。 该系统可以分散在老化测试期间产生的局部热量并使半导体光源棒的局部温度均匀,从而在老化测试期间保持适当的温度并提高热辅助磁记录头的热稳定性。