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    Method of and apparatus for inspecting conductive pattern on printed board
    2.
    发明授权
    Method of and apparatus for inspecting conductive pattern on printed board 失效
    用于检查印刷电路板上导电图案的方法和装置

    公开(公告)号：US5144681A

    公开(公告)日：1992-09-01

    申请号：US674546

    申请日：1991-03-22

    申请人： Ryuji Kitakado ,  Hironobu Yano ,  Hiroaki Kakuma ,  Tetsuo Hoki ,  Takao Kanai

    发明人： Ryuji Kitakado ,  Hironobu Yano ,  Hiroaki Kakuma ,  Tetsuo Hoki ,  Takao Kanai

    IPC分类号： G06T7/00

    CPC分类号： G06T7/0006 ,  G06T2207/30141

    摘要： A printed circuit board (11) is provided with a conductive pattern (P, R) and a through hole (H) thereon. Respective images of the conductive pattern and a through hole are photoelectrically read with an image reader (20). The conductive pattern image is magnified in size to obtain a magnified pattern image (PI.sub.m), while the hole image is magnified at different magnification factors to obtain magnified hole images (HI.sub.n, HI.sub.n-i). A ring image (RP) is defined by the difference of the magnified hole images. The overlapped region (WR) on which the ring image and the magnified pattern image overlap each other is then calculated, and a defect or an opening of the conductive pattern is detected by calculating the aperture angle (.theta.) of the overlapped image.

    摘要翻译： 印刷电路板（11）上设有导电图案（P，R）和通孔（H）。 用图像读取器（20）对导电图案和通孔的各个图像进行光电读取。 导电图案图像的大小被放大以获得放大的图案图像（PIm），而孔图像以不同的放大系数放大以获得放大的孔图像（HIn，HIn-i）。 环形图像（RP）由放大孔图像的差定义。 然后计算环形图像和放大图案图像重叠的重叠区域（WR），并且通过计算重叠图像的孔径角度（θ）来检测导电图案的缺陷或开口。

    Method of and apparatus for inspecting conductive pattern on printed board
    3.
    发明授权
    Method of and apparatus for inspecting conductive pattern on printed board 失效
    用于检查印刷电路板上导电图案的方法和装置

    公开(公告)号：US5027417A

    公开(公告)日：1991-06-25

    申请号：US500294

    申请日：1990-03-27

    申请人： Ryuji Kitakado ,  Hironobu Yano ,  Hiroaki Kakuma ,  Tetsuo Hoki ,  Takao Kanai

    发明人： Ryuji Kitakado ,  Hironobu Yano ,  Hiroaki Kakuma ,  Tetsuo Hoki ,  Takao Kanai

    IPC分类号： G06T7/00

    CPC分类号： G06T7/0006 ,  G06T2207/30141

    摘要： A printed circuit board (11) is provided with a conductive pattern (P, R) and a through hole (H) thereon. Respective images of the conductive pattern and a through hole are photoelectrically read with an image reader (20). The conductive pattern image is magnified in size to obtain a magnified pattern image (PI.sub.m), while the hole image is magnified at different magnification factors to obtain magnified hole images (HI.sub.n, HI.sub.n-i). A ring image (RP) is defined by the difference of the magnified hole images. The overlapped region (WR) on which the ring image and the magnified pattern image overlap each other is then calculated, and a defect or an opening of the conductive pattern is detected by calculating the aperture angle (.theta.) of the overlapped image.

    Pattern masking method and an apparatus therefor
    4.
    发明授权
    Pattern masking method and an apparatus therefor 失效
    图案掩模方法及其装置

    公开(公告)号：US4797939A

    公开(公告)日：1989-01-10

    申请号：US914863

    申请日：1986-10-02

    申请人： Tetsuo Hoki ,  Tetsuo Sano ,  Ryuji Kitakado ,  Yoshinori Sezaki ,  Tomiji Hotta ,  Hironobu Yano

    发明人： Tetsuo Hoki ,  Tetsuo Sano ,  Ryuji Kitakado ,  Yoshinori Sezaki ,  Tomiji Hotta ,  Hironobu Yano

    IPC分类号： G01N21/956 ,  G06T7/00 ,  G06K9/00

    CPC分类号： G06T7/001 ,  G01N21/956 ,  G06T2207/30141

    摘要： A binarized image data group of an inspected object for a plurality of pixels arrayed in the sub-scanning direction is sequentially created in order along the main scanning direction to determine whether or not the pattern of an inputted image corresponds to a standard through-hole pattern on the basis of the binarized image data group. When the determination is of yes, through-hole diameter masking data are sequentially created in order along the main scanning direction to sequentially perform masking processing on the binarized image data group of the inspected object arrayed in the sub-scanning direction. Thus, the through-hole pattern is automatically detected to be subjected to masking processing, whereby an inspected object having through-holes can be inspected by a pattern matching method.

    摘要翻译： 沿着主扫描方向顺序地创建沿副扫描方向排列的多个像素的检查对象的二值化图像数据组，以确定输入图像的图案是否对应于标准通孔图案 在二值化图像数据组的基础上。 当确定为是时，沿着主扫描方向依次创建通孔直径掩蔽数据，以顺序对沿副扫描方向排列的被检查对象的二值化图像数据组执行掩蔽处理。 因此，通孔图案被自动检测以进行掩模处理，从而可以通过图案匹配方法检查具有通孔的检查对象。