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公开(公告)号:US11739417B2
公开(公告)日:2023-08-29
申请号:US16770818
申请日:2018-12-07
Applicant: SAINT-GOBAIN GLASS FRANCE
Inventor: Yohan Faucillon , Vojislav Gajic , Thierry Kauffmann , Etienne Sandre-Chardonnal
CPC classification number: C23C14/3492 , C23C14/35 , C23C14/547 , G05B17/02 , H01J37/3464 , H01J2237/24592
Abstract: An adjustment-determining method includes obtaining a mathematical model relating an operating parameter of the deposition line to a quality function defined from a quality measurement of a stack of thin layers deposited by the deposition line on a transparent substrate; obtaining a value of the quality function from a value of the quality measurement measured at the outlet of the deposition line on a stack of thin layers deposited by the deposition line on a substrate while the deposition line was set so that an operating parameter had a current value; and automatically determining by the mathematical model an adjustment value for the current value of the operating parameter serving to reduce a difference that exists between the value obtained for the quality function and a target value selected for the quality function for the stack of thin layers.