SPUTTERING APPARATUS INCLUDING GAS DISTRIBUTION SYSTEM

    公开(公告)号:US20180033595A1

    公开(公告)日:2018-02-01

    申请号:US15725456

    申请日:2017-10-05

    发明人: Klaus Hartig

    摘要: Some embodiments provide a magnetron sputtering apparatus including a vacuum chamber within which a controlled environment may be established, a target comprising one or more sputterable materials, wherein the target includes a racetrack-shaped sputtering zone that extends longitudinally along a longitudinal axis and comprises a straightaway area sandwiched between a first turnaround area and a second turnaround area, a gas distribution system that supplies a first gas mixture to the first turnaround area and/or the second turnaround area and supplies a second gas mixture to the straightaway area, wherein the first gas mixture reduces a sputtering rate relative to the second gas mixture. In some cases, the first gas mixture includes inert gas having a first atomic weight and the second gas mixture includes inert gas having a second atomic weight, wherein the second atomic weight is heavier than the first atomic weight.

    POWER MODULATION FOR ETCHING HIGH ASPECT RATIO FEATURES

    公开(公告)号:US20170207099A1

    公开(公告)日:2017-07-20

    申请号:US15411241

    申请日:2017-01-20

    IPC分类号: H01L21/306 H01J37/32

    摘要: A method of etching a substrate is described. The method includes disposing a substrate having a surface exposing a first material and a second material in a processing space of a plasma processing system, and performing a modulated plasma etching process to selectively remove the first material at a rate greater than removing the second material. The modulated plasma etching process comprises a power modulation cycle having sequential power application steps that includes: applying a radio frequency (RF) signal to the plasma processing system at a first power level, applying the RF signal to the plasma processing system at a second power level, and applying the RF signal to the plasma processing system at a third power level. Thereafter, the power modulation cycle is repeated at least one more cycle, wherein each modulation cycle includes a modulation time period.