LITHOGRAPHY APPARATUS
    1.
    发明公开

    公开(公告)号:US20240353764A1

    公开(公告)日:2024-10-24

    申请号:US18388298

    申请日:2023-11-09

    IPC分类号: G03F7/00

    摘要: Provided is a lithography apparatus including a wafer stage, a cable connected to the wafer stage, the cable being configured to bend based on the wafer stage moving, a support unit configured to prevent the cable from sagging, the support unit including a plurality of clamps configured to restrict movement of the cable and a connection member connecting the plurality of clamps to each other, and a protective unit under the cable, the protective unit being configured to collide with the support unit based on the wafer stage moving, wherein the protective unit includes ultra-high molecular weight polyethylene (UHMWPE).