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公开(公告)号:US20240353764A1
公开(公告)日:2024-10-24
申请号:US18388298
申请日:2023-11-09
发明人: Kyung Chin YI , Dong Sik Jeong , Sun Ho Kim , Woo-Hyung Kim , Seung Uk Park , Yong Hee Lee
IPC分类号: G03F7/00
CPC分类号: G03F7/70916 , G03F7/70725 , G03F7/70808 , G03F7/7095 , G03F7/70991
摘要: Provided is a lithography apparatus including a wafer stage, a cable connected to the wafer stage, the cable being configured to bend based on the wafer stage moving, a support unit configured to prevent the cable from sagging, the support unit including a plurality of clamps configured to restrict movement of the cable and a connection member connecting the plurality of clamps to each other, and a protective unit under the cable, the protective unit being configured to collide with the support unit based on the wafer stage moving, wherein the protective unit includes ultra-high molecular weight polyethylene (UHMWPE).