公开(公告)号：US20170168910A1

公开(公告)日：2017-06-15

申请号：US15378871

申请日：2016-12-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jong-min KIM ,  Chan-ho YOON ,  Jung-pil LEE ,  Hyung-joon PARK ,  Jae-ho SIM

IPC: G06F11/22 ,  G06F11/07 ,  G06F11/273 ,  H01L23/544

CPC classification number: G06F11/2215 ,  G06F11/079 ,  G06F11/273 ,  G06F11/2733 ,  G06F11/3656 ,  H01L23/544 ,  H01L2223/54433 ,  H01L2223/54446

Abstract: Provided are a multichip debugging method and a multichip system adopting the same. The multichip system includes: a first chip including a first debugging port and first identification (ID) information, a second chip including a second debugging port and second ID information, and a test access port (TAP) electrically connected to the first debugging port and the second debugging port and configured to connect to a test apparatus via the TAP.