公开(公告)号：US20240319265A1

公开(公告)日：2024-09-26

申请号：US18609802

申请日：2024-03-19

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seongkwan LEE ,  Junyeon WON ,  Minho KANG ,  Cheolmin PARK ,  Jaemoo CHOI

IPC: G01R31/28

CPC classification number: G01R31/2896 ,  G01R31/287

Abstract: A test device for testing a semiconductor, the test device comprising: a pulse signal generator that is configured to generate a first pulse signal and transmit the first pulse signal through channels; a sampler that is configured to receive the first pulse signal through the channels and conduct a sampling process on the first pulse signal, based on a second pulse signal; a width analyzer that is configured to measure a first width of the first pulse signal and generate a first measurement value, based on a result of the sampling process; and a calculator that is configured to output a test result corresponding to each of the channels of the test device, based on the first measurement value.