公开(公告)号：US20170160341A1

公开(公告)日：2017-06-08

申请号：US15286626

申请日：2016-10-06

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： JAE WAN HONG ,  JEONG HOI KIM ,  YU SIN YANG ,  SANG KIL LEE ,  CHUNG SAM JUN

IPC: G01R31/28 ,  G01R1/04

CPC classification number: G01R31/2891 ,  G01R1/0416 ,  G01R1/06705

Abstract: An apparatus for exchanging a probe includes a stacker configured to receive a probe and to align the probe, a probe connector connected to the probe, and a laser alignment unit including a light emitter and a light receiver. The light emitter is configured to emit a laser beam to the probe, and the light receiver is configured to detect the laser beam reflected by the probe. The laser alignment unit is configured to detect when the probe is properly aligned on the probe connector using the light receiver, and the laser alignment unit is configured to stop moving the stacker when it is detected that the probe is properly aligned.