公开(公告)号：US20230058920A1

公开(公告)日：2023-02-23

申请号：US17876144

申请日：2022-07-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Mallikarjun Shivappa BIDARI ,  Divakar KULKARNI ,  Raju Siddappa UDAVA ,  Shashank VIMAL ,  Tushar VRIND ,  Venkata Raju INDUKURI ,  Harish Kumar Veerappanchatram SUNDARAMURTHY ,  Rajiv HASIJA

IPC: G06F9/52 ,  G06F9/38 ,  G06F9/48

Abstract: A multicore computing device includes a memory and a processor coupled to the memory. The processor includes plural cores and a multiple input multiple output (MIMO) block coupled to the cores. The MIMO block receives a halt request from a first core of the cores, transmits a core-halt request to one or more other cores other than the first core, to halt execution of the one or more other cores, and permits the first core to lock with a shared resource.

公开(公告)号：US20230214321A1

公开(公告)日：2023-07-06

申请号：US17848716

申请日：2022-06-24

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Surendra SINGH ,  Dinesh GEHLOT ,  Mallikarjun Shivappa BIDARI ,  Raju Udava SIDDAPPA ,  Shashank VIMAL ,  Shreya GANATRA ,  Sujay Shankar GAITONDE ,  Tushar VRIND ,  Venkata Raju INDUKURI

IPC: G06F12/02 ,  G06F9/32 ,  G06F9/30

CPC classification number: G06F12/0253 ,  G06F12/0238 ,  G06F9/321 ,  G06F9/3004

Abstract: A method for managing memory leaks in a memory device includes grouping, by a garbage collection system, a plurality of similar memory allocations of the memory device into one or more Unique Fixed Identifiers (UFIs); identifying, by the garbage collection system, one of the one or more UFIs having a highest accumulated memory size and adding each of the plurality of memory allocations in the identified one of the one or more UFIs into a Potential Leak Candidate List (PLCL); identifying, by the garbage collection system, the memory leaks in the memory device by identifying unreferenced memory addresses associated with the plurality of memory allocations in the PLCL; and releasing, by the garbage collection system, the identified unreferenced memory addresses associated with the plurality of memory allocations corresponding to the memory leaks into the memory device.