公开(公告)号：US20210088858A1

公开(公告)日：2021-03-25

申请号：US16095840

申请日：2018-08-03

Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.

Inventor： Ping LUO ,  Dong LUO

IPC: G02F1/1362 ,  G02F1/1335 ,  G02F1/1343 ,  G02F1/1339

Abstract: A liquid crystal panel including an array substrate and a color filter substrate which are disposed opposite and multiple fan-out lines and a color resist layer stacked along a direction from the array substrate toward the color filter substrate. The color film substrate is provided with a common electrode layer. A color resist layer and a columnar spacer are mutually abutted to ensure a distance between the array substrate and the color filter. The color resist layer includes a first plane facing the columnar spacer, and the common electrode line or the common electrode layer surrounds the color resist layer and exposes the first plane. When the liquid crystal panel is subjected to a larger external force such that deformation or displacement occurs between the columnar spacer and the color resist layer, the common electrode line and the common electrode layer are not conductive to form a short circuit.

公开(公告)号：US20150323314A1

公开(公告)日：2015-11-12

申请号：US14239116

申请日：2014-01-14

Applicant: Shenzhen China Star Optoelectronics Technology Co. Ltd.

Inventor： Ping LUO

IPC: G01B11/27 ,  G02F1/13 ,  G02F1/1333 ,  G01N1/28

CPC classification number: G01B11/27 ,  G01N1/286 ,  G02F1/1303 ,  G02F1/1333 ,  G02F2001/133354

Abstract: The present invention relates to an alignment inspecting system for liquid crystal substrate, which means an aligning system of liquid crystal substrate alignment inspecting apparatus after HVA (high resolution vertical alignment) alignment, comprises an alignment mechanism located on corners of the substrate, and the alignment mechanism including a horizontal alignment device for exerting pressure to edges of the substrate, wherein a flattening device for applying longitudinal pressure to the substrate is further included. The present invention can be concluded with the following advantages: this alignment inspecting system for liquid crystal substrate can be used to correct the bending of the substrate during alignment process, so as to reduce the bending and deformation of the substrate which in turn creates poor contact between the probe and the substrate. As a result, incorrect reading can be avoided.

Abstract translation: 本发明涉及一种用于液晶基板的对准检查系统，这意味着在HVA（高分辨率垂直对准）对准之后的液晶基板对准检查装置的对准系统包括位于基板的角部上的对准机构和对准 机构包括用于向基板的边缘施加压力的水平对准装置，其中还包括用于向基板施加纵向压力的平坦化装置。 本发明可以得出以下优点：该液晶基板对准检查系统可用于校正校准过程中衬底的弯曲，从而减小衬底的弯曲和变形，从而导致接触不良 在探针和基底之间。 结果，可以避免不正确的阅读。