公开(公告)号：US20230401688A1

公开(公告)日：2023-12-14

申请号：US18026716

申请日：2021-09-15

Applicant: SHIMADZU CORPORATION

Inventor： Naoto MISHINA ,  Hirofumi OKAMOTO ,  Takashi TANAKA ,  Satoru SUGIMOTO ,  Masashi HAYAKAWA ,  Takahide HATAHORI ,  Hiroshi HORIKAWA

IPC: G06T7/00 ,  G01N21/45 ,  G01N21/01

CPC classification number: G06T7/0004 ,  G01N21/45 ,  G01N21/01 ,  G01N2201/06113 ,  G06T2207/30204

Abstract: A defect inspection apparatus (100) includes an imager (image sensor 35) configured to image an inspection target 7, and a display (6) configured to display an image based on an image captured by the imager. The defect inspection apparatus (100) also includes a controller (4) configured or programmed to receive a setting of a marking (64) in a predetermined region of interest (S) on the image (still image 61) displayed on the display (6). The controller (4) is configured or programmed to inspect the inspection target (7) for a defect based on the image captured by the imager, and superimpose an image of the marking (64) on a position corresponding to the predetermined region of interest (S) in an image of an inspection result (overlay image 65) displayed on the display (6).

公开(公告)号：US20230306575A1

公开(公告)日：2023-09-28

申请号：US18124225

申请日：2023-03-21

Applicant: SHIMADZU CORPORATION

Inventor： Naoto MISHINA ,  Hiroshi HORIKAWA ,  Satoru SUGIMOTO

IPC: G06T7/00

CPC classification number: G06T7/0004 ,  G06T2200/24

Abstract: A defect detection device includes: an excitation unit configured to apply vibration to an inspection object; a vibration state image creation unit configured to measure by an optical means a vibration state in a measurement area on a surface of the inspection object to which the vibration is applied, and to create one or more types of vibration state images representing the vibration state in the measurement area depending on a result of the measurement; an optical image acquisition unit configured to acquire an optical image in the measurement area; an image display unit configured to display an image; and a display control unit configured to perform control to simultaneously display two images among the one or more types of vibration state images and the optical image for the same area in the measurement area on the image display unit.

公开(公告)号：US20220281617A1

公开(公告)日：2022-09-08

申请号：US17628143

申请日：2019-07-19

Applicant: SHIMADZU CORPORATION

Inventor： Koji MORITA ,  Hiroshi HORIKAWA ,  Hiroshi YAGI

IPC: B64F5/60 ,  G06T7/00 ,  G06T17/10 ,  G06V10/141 ,  G02B27/01

Abstract: This aircraft inspection support device (100) is provided with a three-dimensional model generation unit (25a), an inspection position acquisition unit (25b), and a control unit (25) configured to perform control to acquire an inspection result (50) of an inspection target (40) and cause the three-dimensional model position (55) on the three-dimensional model (52) corresponding to the inspection position (53), an inspection position (53), and an inspection result (50) to be stored in association with each other.

公开(公告)号：US20240230601A1

公开(公告)日：2024-07-11

申请号：US18290270

申请日：2022-03-25

Applicant: SHIMADZU CORPORATION

Inventor： Hiroshi HORIKAWA ,  Kenji TAKUBO ,  Takahide HATAHORI

IPC: G01N29/24 ,  G01N29/04 ,  G01N29/32

CPC classification number: G01N29/2418 ,  G01N29/041 ,  G01N29/32 ,  G01N2291/0289

Abstract: A defect inspection apparatus (100) according to the present invention includes an exciter (1), an irradiator (laser illuminator 2) configured to irradiate an inspection target (8) with laser light, and a measurer (3) configured to change a phase of the laser light reflected by the inspection target (8) to cause the laser light having an unchanged phase to interfere with the laser light having a changed phase, and to measure the interference light. The measurer (3) is configured to acquire an interference image (71) representing a vibration state of the inspection target (8) as viewed in a direction extending along a first light path (21), and an interference image (72) representing a vibration state of the inspection target (8) as viewed in a direction extending along a second light path (22) in which the reflected laser light travels from the inspection target (8) in a direction different from the first light path (21).

公开(公告)号：US20210385416A1

公开(公告)日：2021-12-09

申请号：US17285820

申请日：2019-10-17

Applicant: Shimadzu Corporation

Inventor： Hiroshi HORIKAWA ,  Hiroshi YAGI ,  Takashi TANAKA ,  Koji MORITA ,  Hirotaka SATO ,  Masuto KITAMURA

IPC: H04N7/18 ,  G01M17/00

Abstract: This aircraft inspection support device includes a first imaging unit configured to capture a measurement information image displayed on a measurement instrument-side display unit of a specific measurement instrument associated with a model of an aircraft or an inspection target of an aircraft component, the measurement instrument-side display unit being configured to display measurement information on the inspection target, and an operator-side display unit configured to display the measurement information image so as to be visible to an inspection operator who is performing an inspection operation near the inspection target.

公开(公告)号：US20230251204A1

公开(公告)日：2023-08-10

申请号：US18013401

申请日：2020-07-02

Applicant: Shimadzu Corporation

Inventor： Hiroshi HORIKAWA ,  Kenji TAKUBO

IPC: G01N21/88 ,  G01N29/04 ,  G01B9/02 ,  G01B9/02098

CPC classification number: G01N21/8806 ,  G01N29/045 ,  G01B9/02095 ,  G01B9/02098 ,  G01N2201/06113 ,  G01N2021/1765

Abstract: This defect inspection apparatus (100) is provided with an excitation unit (1), a laser illumination unit (2), an interference unit (30), an imaging unit (31), a holding member (4) for holding the imaging unit at a position spaced apart from an inspection target (90) by a predetermined distance, a connecting member (5) for connecting the holding member or the imaging unit and the excitation unit, and a controller (6) for generating an image (61) related to the propagation of an elastic wave on an inspection target.