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公开(公告)号：US20230401688A1
公开(公告)日：2023-12-14
申请号：US18026716
申请日：2021-09-15
Applicant: SHIMADZU CORPORATION
Inventor： Naoto MISHINA , Hirofumi OKAMOTO , Takashi TANAKA , Satoru SUGIMOTO , Masashi HAYAKAWA , Takahide HATAHORI , Hiroshi HORIKAWA
CPC classification number: G06T7/0004 , G01N21/45 , G01N21/01 , G01N2201/06113 , G06T2207/30204
Abstract: A defect inspection apparatus (100) includes an imager (image sensor 35) configured to image an inspection target 7, and a display (6) configured to display an image based on an image captured by the imager. The defect inspection apparatus (100) also includes a controller (4) configured or programmed to receive a setting of a marking (64) in a predetermined region of interest (S) on the image (still image 61) displayed on the display (6). The controller (4) is configured or programmed to inspect the inspection target (7) for a defect based on the image captured by the imager, and superimpose an image of the marking (64) on a position corresponding to the predetermined region of interest (S) in an image of an inspection result (overlay image 65) displayed on the display (6).
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公开(公告)号：US20210385416A1
公开(公告)日：2021-12-09
申请号：US17285820
申请日：2019-10-17
Applicant: Shimadzu Corporation
Inventor： Hiroshi HORIKAWA , Hiroshi YAGI , Takashi TANAKA , Koji MORITA , Hirotaka SATO , Masuto KITAMURA
Abstract: This aircraft inspection support device includes a first imaging unit configured to capture a measurement information image displayed on a measurement instrument-side display unit of a specific measurement instrument associated with a model of an aircraft or an inspection target of an aircraft component, the measurement instrument-side display unit being configured to display measurement information on the inspection target, and an operator-side display unit configured to display the measurement information image so as to be visible to an inspection operator who is performing an inspection operation near the inspection target.
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