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公开(公告)号:US20180017464A1
公开(公告)日:2018-01-18
申请号:US15539267
申请日:2015-12-22
Applicant: SOLiD, INC.
Inventor: Keewoon NA
IPC: G01M11/00 , H04B10/50 , H04B10/079 , H04B10/572
CPC classification number: G01M11/3127 , G01M11/3145 , G01M11/3181 , G01M11/331 , H04B10/071 , H04B10/0795 , H04B10/0799 , H04B10/503 , H04B10/572
Abstract: An optical line testing device for measuring at least a cutting position of an optical line according to the present invention includes: a first wavelength tunable laser source configured to generate a first optical signal in which a plurality of wavelengths appear alternately and periodically; a second wavelength tunable laser source configured to generate a second optical signal which is identical to the first optical signal but has an adjustable delay time; and an interferometer configured to cause interference between a reflected optical signal, corresponding to the first optical signal, which is returning after having been emitted to the optical line, and the second optical signal to output an interference signal.
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公开(公告)号:US20190234831A1
公开(公告)日:2019-08-01
申请号:US16381281
申请日:2019-04-11
Applicant: SOLiD, INC.
Inventor: Keewoon NA
IPC: G01M11/00 , H04B10/079 , H04B10/572 , H04B10/50 , H04B10/071
CPC classification number: G01M11/3127 , G01M11/3145 , G01M11/3181 , G01M11/331 , H04B10/071 , H04B10/0795 , H04B10/0799 , H04B10/503 , H04B10/572
Abstract: An optical line testing device for measuring at least a cutting position of an optical line according to the present invention includes: a first wavelength tunable laser source configured to generate a first optical signal in which a plurality of wavelengths appear alternately and periodically; a second wavelength tunable laser source configured to generate a second optical signal which is identical to the first optical signal but has an adjustable delay time; and an interferometer configured to cause interference between a reflected optical signal, corresponding to the first optical signal, which is returning after having been emitted to the optical line, and the second optical signal to output an interference signal.
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