公开(公告)号：US10935457B2

公开(公告)日：2021-03-02

申请号：US16381281

申请日：2019-04-11

Applicant: SOLiD, INC.

Inventor： Keewoon Na

IPC: G01M11/00 ,  H04B10/071 ,  H04B10/079 ,  H04B10/50 ,  H04B10/572

Abstract: An optical line testing device for measuring at least a cutting position of an optical line according to the present invention includes: a first wavelength tunable laser source configured to generate a first optical signal in which a plurality of wavelengths appear alternately and periodically; a second wavelength tunable laser source configured to generate a second optical signal which is identical to the first optical signal but has an adjustable delay time; and an interferometer configured to cause interference between a reflected optical signal, corresponding to the first optical signal, which is returning after having been emitted to the optical line, and the second optical signal to output an interference signal.

公开(公告)号：US10274398B2

公开(公告)日：2019-04-30

申请号：US15539267

申请日：2015-12-22

Applicant: SOLiD, INC.

Inventor： Keewoon Na

IPC: G01M11/00 ,  H04B10/071 ,  H04B10/079 ,  H04B10/50 ,  H04B10/572

Abstract: An optical line testing device for measuring at least a cutting position of an optical line according to the present invention includes: a first wavelength tunable laser source configured to generate a first optical signal in which a plurality of wavelengths appear alternately and periodically; a second wavelength tunable laser source configured to generate a second optical signal which is identical to the first optical signal but has an adjustable delay time; and an interferometer configured to cause interference between a reflected optical signal, corresponding to the first optical signal, which is returning after having been emitted to the optical line, and the second optical signal to output an interference signal.