公开(公告)号：US20150022672A1

公开(公告)日：2015-01-22

申请号：US14511464

申请日：2014-10-10

Applicant: SONY CORPORATION

Inventor： KUNIHIKO NAGAMINE ,  SATOSHI TOMIOKA

IPC: G01J3/50 ,  G01J3/46 ,  H04N17/02

CPC classification number: G01J3/506 ,  G01J3/462 ,  H04N17/02

Abstract: An unevenness inspection apparatus including: an image pickup section obtaining a pickup image of a test object; an image generating section generating each of a color unevenness inspection image and a luminance unevenness inspection image based on the pickup image; a calculating section calculating an evaluation parameter using both of the color unevenness inspection image and the luminance unevenness inspection image; and an inspecting section performing unevenness inspection using the calculated evaluation parameter. The calculating section calculates the evaluation parameter in consideration of unevenness visibility for both color and luminance.

Abstract translation: 一种不均匀性检查装置，包括：图像拾取部件，其获得测试对象的拾取图像; 图像生成部，其基于所述拍摄图像生成颜色不均匀性检查图像和亮度不均匀性检查图像; 计算部，使用所述颜色不均匀检查图像和所述亮度不均匀检查图像两者来计算评价参数; 以及使用所计算的评价参数进行不均匀性检查的检查部。 考虑到颜色和亮度两者的不均匀性可见度，计算部分计算评价参数。