公开(公告)号：US11150279B2

公开(公告)日：2021-10-19

申请号：US16554248

申请日：2019-08-28

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Vanni Poletto ,  Riccardo Miglierina ,  Antonio Davide Leone ,  Sergio Lecce

IPC: G01R31/34 ,  G01R19/165 ,  G11C27/02 ,  H03F3/45

Abstract: A circuit includes a switching circuit including a first switch and a second switch. A current sensing circuit is coupled to the switching circuit to sense a first current through the first switch and to generate a first sensed current signal based on the sensed first current, and configured to sense a second current through the second switch and to generate a second sensed current signal based on the sensed second current. An output circuit is coupled to the current sensing circuit and is configured to generate a failure signal based on the first sensed current signal and the second sensed current signal.

公开(公告)号：US10215782B2

公开(公告)日：2019-02-26

申请号：US15372127

申请日：2016-12-07

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Vanni Poletto ,  Riccardo Miglierina ,  Antonio Davide Leone ,  Sergio Lecce

IPC: G01R19/165 ,  G11C27/02 ,  H03F3/45 ,  G01R31/34

Abstract: A device measures the current in an inductive load using two separate current-measuring paths to detect the current in the inductive load. The inductive load is connected between first and second nodes, and the first node connected to a first voltage. The device includes first and second transistors cascaded together between the first node and a third node that is connected to a second voltage. First and second sense amplifiers measure the current in the inductive load. The first and second sense amplifiers are connected to at least one terminal of the first and second transistors. Two blocks sample and hold signals from the first and second sense amplifiers, which represent, respectively, the currents in the two separate current-measuring paths. The two currents are subtracted in a comparison node for generating an error signal that is compared with a predefined window and if outside the window a failure signal is generated.

公开(公告)号：US10444264B2

公开(公告)日：2019-10-15

申请号：US16262521

申请日：2019-01-30

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Vanni Poletto ,  Riccardo Miglierina ,  Antonio Davide Leone ,  Sergio Lecce

IPC: G01R19/165 ,  G01R31/34 ,  H03F3/45 ,  G11C27/02

Abstract: A device measures the current in an inductive load using two separate current-measuring paths to detect the current in the inductive load. The inductive load is connected between first and second nodes, and the first node connected to a first voltage. The device includes first and second transistors cascaded together between the first node and a third node that is connected to a second voltage. First and second sense amplifiers measure the current in the inductive load. The first and second sense amplifiers are connected to at least one terminal of the first and second transistors. Two blocks sample and hold signals from the first and second sense amplifiers, which represent, respectively, the currents in the two separate current-measuring paths. The two currents are subtracted in a comparison node for generating an error signal that is compared with a predefined window and if outside the window a failure signal is generated.

公开(公告)号：US20190383861A1

公开(公告)日：2019-12-19

申请号：US16554248

申请日：2019-08-28

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Vanni Poletto ,  Riccardo Miglierina ,  Antonio Davide Leone ,  Sergio Lecce

IPC: G01R19/165 ,  G01R31/34 ,  G11C27/02 ,  H03F3/45

Abstract: A circuit includes a switching circuit including a first switch and a second switch. A current sensing circuit is coupled to the switching circuit to sense a first current through the first switch and to generate a first sensed current signal based on the sensed first current, and configured to sense a second current through the second switch and to generate a second sensed current signal based on the sensed second current. An output circuit is coupled to the current sensing circuit and is configured to generate a failure signal based on the first sensed current signal and the second sensed current signal.

公开(公告)号：US20190162759A1

公开(公告)日：2019-05-30

申请号：US16262521

申请日：2019-01-30

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Vanni Poletto ,  Riccardo Miglierina ,  Antonio Davide Leone ,  Sergio Lecce

IPC: G01R19/165 ,  G01R31/34 ,  G11C27/02 ,  H03F3/45

CPC classification number: G01R19/1659 ,  G01R31/343 ,  G11C27/02 ,  H03F3/45179 ,  H03F2200/462

Abstract: A device measures the current in an inductive load using two separate current-measuring paths to detect the current in the inductive load. The inductive load is connected between first and second nodes, and the first node connected to a first voltage. The device includes first and second transistors cascaded together between the first node and a third node that is connected to a second voltage. First and second sense amplifiers measure the current in the inductive load. The first and second sense amplifiers are connected to at least one terminal of the first and second transistors. Two blocks sample and hold signals from the first and second sense amplifiers, which represent, respectively, the currents in the two separate current-measuring paths. The two currents are subtracted in a comparison node for generating an error signal that is compared with a predefined window and if outside the window a failure signal is generated.

公开(公告)号：US20170322240A1

公开(公告)日：2017-11-09

申请号：US15372127

申请日：2016-12-07

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Vanni Poletto ,  Riccardo Miglierina ,  Antonio Davide Leone ,  Sergio Lecce

IPC: G01R19/165 ,  G11C27/02 ,  H03F3/45

CPC classification number: G01R19/1659 ,  G01R31/343 ,  G11C27/02 ,  H03F3/45179 ,  H03F2200/462

Abstract: A device measures the current in an inductive load using two separate current-measuring paths to detect the current in the inductive load. The inductive load is connected between first and second nodes, and the first node connected to a first voltage. The device includes first and second transistors cascaded together between the first node and a third node that is connected to a second voltage. First and second sense amplifiers measure the current in the inductive load. The first and second sense amplifiers are connected to at least one terminal of the first and second transistors. Two blocks sample and hold signals from the first and second sense amplifiers, which represent, respectively, the currents in the two separate current-measuring paths. The two currents are subtracted in a comparison node for generating an error signal that is compared with a predefined window and if outside the window a failure signal is generated.