公开(公告)号：US20040225918A1

公开(公告)日：2004-11-11

申请号：US10434820

申请日：2003-05-09

Applicant: STMicroelectronics, Inc.

Inventor： Serge Fruhauf ,  Taylor J. Leaming ,  Alain C. Pomet

IPC: H04B001/74

CPC classification number: G06K7/10465 ,  G06K7/0008 ,  G06K7/0095 ,  G06K19/07 ,  G06K19/07733

Abstract: An integrated circuit for a smart card may include a universal serial bus (USB) transceiver for communicating with a USB host device, and a microprocessor connected to the USB transceiver and operable in a test mode and a user mode. When in the test mode, the microprocessor may perform a test operation based upon receiving at least one test vendor specific request (VSR) from the USB host device via the at least one USB transceiver. By way of example, the test operation may include scan testing the microprocessor's control logic, detecting a status of at least one buffer and communicating the status to the USB host device, writing test data to at least one designated buffer and sending the test data from the at least one designated buffer to the USB host device, and/or operating with reduced power.

Abstract translation: 用于智能卡的集成电路可以包括用于与USB主机设备通信的通用串行总线（USB）收发器和连接到USB收发器的微处理器，并且可以在测试模式和用户模式下操作。 当处于测试模式时，微处理器可以经由至少一个USB收发器从USB主机设备接收至少一个测试供应商特定请求（VSR）来执行测试操作。 作为示例，测试操作可以包括对微处理器的控制逻辑进行扫描测试，检测至少一个缓冲器的状态并将状态传送到USB主机设备，将测试数据写入至少一个指定的缓冲器，并将测试数据从 所述至少一个指定的缓冲器到达所述USB主机设备，和/或以降低的功率运行。