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公开(公告)号:US20230048614A1
公开(公告)日:2023-02-16
申请号:US17880473
申请日:2022-08-03
Applicant: STMICROELECTRONICS (TOURS) SAS
Inventor: Patrick HAUTTECOEUR
IPC: H01L21/324 , H01L21/02
Abstract: The present description concerns a method of manufacturing a device comprising at least one radio frequency component on a semiconductor substrate comprising: a) a laser anneal of a first thickness of the substrate on the upper surface side of the substrate; b) the forming of an insulating layer on the upper surface of the substrate; and c) the forming of said at least one radio frequency component on the insulating layer.
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公开(公告)号:US20230197835A1
公开(公告)日:2023-06-22
申请号:US18110095
申请日:2023-02-15
Applicant: STMicroelectronics (Tours) SAS
Inventor: Patrick HAUTTECOEUR , Vincent CARO
IPC: H01L29/747 , H01L29/66 , H01L29/06
CPC classification number: H01L29/747 , H01L29/0661 , H01L29/66386
Abstract: A device includes a semiconductor substrate. A step is formed at a periphery of the semiconductor substrate. A first layer, made of polysilicon doped in oxygen, is deposited on top of and in contact with a first surface of the substrate. This first layer extends at least on a wall and bottom of the step. A second layer, made of glass, is deposited on top of the first layer and the edges of the first layer. The second layer forms a boss between the step and a central area of the device.
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公开(公告)号:US20210280698A1
公开(公告)日:2021-09-09
申请号:US17188826
申请日:2021-03-01
Applicant: STMicroelectronics (Tours) SAS
Inventor: Patrick HAUTTECOEUR , Vincent CARO
IPC: H01L29/747 , H01L29/66 , H01L29/06
Abstract: A device includes a semiconductor substrate. A step is formed at a periphery of the semiconductor substrate. A first layer, made of polysilicon doped in oxygen, is deposited on top of and in contact with a first surface of the substrate. This first layer extends at least on a wall and bottom of the step. A second layer, made of glass, is deposited on top of the first layer and the edges of the first layer. The second layer forms a boss between the step and a central area of the device.
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