公开(公告)号：US20250027985A1

公开(公告)日：2025-01-23

申请号：US18752038

申请日：2024-06-24

Applicant: STMicroelectronics International N.V.

Inventor： Emanuele Moretti ,  Mauro Foppiani

IPC: G01R31/27 ,  G01R31/00 ,  G01R31/26 ,  G01R31/30 ,  G01R31/52

Abstract: A test circuit includes a set of electronic switches having a current path between a first node and a ground node, where each electronic switch has a respective control node. A set of coupling channels have one end coupled to a common test node and other ends coupled to the respective control nodes of electronic switches. A stress voltage supply source is coupled to the common test node. A set of comparator circuits includes comparator circuits having a first input node coupled, via sensing circuitry, to the control node of respective electronic switches in the set of electronic switches and having second nodes coupled to a threshold voltage node. A method of operating the test circuit is also disclosed.