公开(公告)号：US20210270699A1

公开(公告)日：2021-09-02

申请号：US17318831

申请日：2021-05-12

Applicant: STMicroelectronics S.r.l.

Inventor： Marco Piazza ,  Antonio Canciamilla ,  Piero Orlandi ,  Luca Maggi

IPC: G01M11/00 ,  G02B6/293 ,  G01M11/02 ,  G01R31/3185 ,  G01R31/317

Abstract: A method of testing a photonic device includes providing a plurality of optical test signals at respective inputs of a first plurality of inputs of an optical input circuit located on a substrate, combining the plurality of optical test signals into a combined optical test signal at an output of the optical input circuit, transmitting the combined optical test signal through the output to an input waveguide of an optical device under test, the optical device under test being located on the substrate, and measuring a response of the optical device under test to the combined optical test signal. Each of the plurality of optical test signals comprises a respective dominant wavelength of a plurality of dominant wavelengths.

公开(公告)号：US20250116570A1

公开(公告)日：2025-04-10

申请号：US18988238

申请日：2024-12-19

Applicant: STMicroelectronics S.r.l.

Inventor： Marco Piazza ,  Antonio Canciamilla ,  Piero Orlandi ,  Luca Maggi

IPC: G01M11/00 ,  G01M11/02 ,  G01R31/317 ,  G01R31/3185 ,  G02B6/293

Abstract: A method of testing a photonic device includes providing a plurality of optical test signals at respective inputs of a first plurality of inputs of an optical input circuit located on a substrate, combining the plurality of optical test signals into a combined optical test signal at an output of the optical input circuit, transmitting the combined optical test signal through the output to an input waveguide of an optical device under test, the optical device under test being located on the substrate, and measuring a response of the optical device under test to the combined optical test signal. Each of the plurality of optical test signals comprises a respective dominant wavelength of a plurality of dominant wavelengths.

公开(公告)号：US10393967B2

公开(公告)日：2019-08-27

申请号：US15968625

申请日：2018-05-01

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Marco Piazza ,  Piero Orlandi ,  Antonio Canciamilla

IPC: G02B6/30 ,  G02B6/122 ,  G02B6/12 ,  G02B6/34

Abstract: An optical waveguide includes opposed end sections for optical radiation to propagate in a longitudinal direction therebetween and an intermediate section extending between the end sections. The intermediate section includes first and second portions superposed in a superposition direction. One of the opposite end sections has a first height in the superposition direction corresponding to the sum of the heights of the superposed portions of the intermediate section. The other of the opposite end sections has a second height in the superposition direction corresponding to the height of the first of the superposed portions of the intermediate section.

公开(公告)号：US12216020B2

公开(公告)日：2025-02-04

申请号：US17318831

申请日：2021-05-12

Applicant: STMicroelectronics S.r.l.

Inventor： Marco Piazza ,  Antonio Canciamilla ,  Piero Orlandi ,  Luca Maggi

IPC: G01M11/00 ,  G01M11/02 ,  G01R31/317 ,  G01R31/3185 ,  G02B6/293

Abstract: A method of testing a photonic device includes providing a plurality of optical test signals at respective inputs of a first plurality of inputs of an optical input circuit located on a substrate, combining the plurality of optical test signals into a combined optical test signal at an output of the optical input circuit, transmitting the combined optical test signal through the output to an input waveguide of an optical device under test, the optical device under test being located on the substrate, and measuring a response of the optical device under test to the combined optical test signal. Each of the plurality of optical test signals comprises a respective dominant wavelength of a plurality of dominant wavelengths.