公开(公告)号：US12057180B2

公开(公告)日：2024-08-06

申请号：US17934102

申请日：2022-09-21

Applicant: STMicroelectronics S.r.l. ,  STMicroelectronics (Rousset) SAS

Inventor： Francesco La Rosa ,  Antonino Conte ,  Francois Maugain

IPC: G11C16/00 ,  G11C16/14 ,  G11C16/26 ,  G11C16/34 ,  H10B41/30 ,  H10B41/40

CPC classification number: G11C16/3445 ,  G11C16/14 ,  G11C16/26 ,  G11C16/3459 ,  G11C16/349 ,  H10B41/30 ,  H10B41/40

Abstract: In an embodiment a non-volatile memory device includes a memory array having a plurality of memory cells, a control unit operatively coupled to the memory array, a biasing stage controllable by the control unit and configured to apply a biasing configuration to the memory cells to perform a memory operation and a reading stage coupled to the memory array and controllable by the control unit, the reading stage configured to verify whether the memory operation has been successful based on a verify level, wherein the control unit is configured to adaptively modify a value of the verify level based on an ageing of the memory cells.

公开(公告)号：US20230091464A1

公开(公告)日：2023-03-23

申请号：US17934102

申请日：2022-09-21

Applicant: STMicroelectronics S.r.I. ,  STMicroelectronics ( Rousset) SAS

Inventor： Francesco La Rosa ,  Antonino Conte ,  Francois Maugain

IPC: G11C16/34 ,  H01L27/11526 ,  G11C16/26 ,  G11C16/14 ,  H01L27/11521

Abstract: In an embodiment a non-volatile memory device includes a memory array having a plurality of memory cells, a control unit operatively coupled to the memory array, a biasing stage controllable by the control unit and configured to apply a biasing configuration to the memory cells to perform a memory operation and a reading stage coupled to the memory array and controllable by the control unit, the reading stage configured to verify whether the memory operation has been successful based on a verify level, wherein the control unit is configured to adaptively modify a value of the verify level based on an ageing of the memory cells.