Abstract:
An electrically erasable and programmable memory includes an array of memory cells, and a distribution line linked to a receiving terminal of an external supply voltage and to a booster circuit. The distribution line provides an internal supply voltage. The distribution line is also linked to the receiving terminal through a diode or a diode circuit simulating operation of a diode. The memory includes a regulator for triggering the booster circuit when the internal supply voltage becomes lower than a threshold so as to maintain the internal supply voltage close to the threshold when the external supply voltage is too low, at least during the reading of memory cells. The diode or the diode circuit is blocked when the external supply voltage is too low.
Abstract:
A power on reset circuit (POR) includes a first reset circuit for delivering a first reset signal when a supply voltage of the POR circuit is between a first low threshold and a first high threshold, and a second reset circuit for delivering a second reset signal when the supply voltage is between a second low threshold and a second high threshold. The second high threshold is less than the first high threshold. The POR circuit further includes at least one electrically erasable and programmable non-volatile memory cell. A delivery circuit outputs the first reset signal or the second reset based upon on whether the at least one electrically erasable and programmable non-volatile memory cell is in an erased or programmed state. The POR circuit has a threshold for outputting the first or second reset signal that is programmable according to the intended application.
Abstract:
A comparator compares a first voltage applied to a first input to a second voltage applied to a second input. The comparator delivers an output signal having a first value when the second voltage is higher than the first voltage, and having a second value when the second voltage is lower than the first voltage. The comparator includes first and second PMOS transistors arranged as current mirrors. The first PMOS transistor has its source connected to the first input of the comparator for receiving the first voltage. The second PMOS transistor has its source connected to the second input of the comparator for receiving the second voltage. The output of the comparator is connected to the drain of one of the transistors.
Abstract:
A current or voltage generator is integrated onto a silicon wafer and may include a first element including a first NMOS transistor having its source connected to ground through an electrical resistance, a second element including a second NMOS transistor having its source connected to ground, and a bias circuit for the first and second elements. The second element may include a voltage divider. The gate of the second NMOS transistor may be connected to a dividing node of the voltage divider, and the anode of the voltage divider may be connected to the gate of the first NMOS transistor. Both elements may be biased at an operating point corresponding to an identical temperature stability point for both elements.