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公开(公告)号:US20220199648A1
公开(公告)日:2022-06-23
申请号:US17544665
申请日:2021-12-07
Applicant: STMicroelectronics SA , STMicroelectronics (Crolles 2) SAS
Inventor: Olivier WEBER , Christophe LECOCQ
IPC: H01L27/12 , H01L27/02 , H01L27/092 , H01L21/84 , H01L21/8238
Abstract: An integrated circuit includes at least a first standard cell framed by two second standard cells. The three cells are disposed adjacent to each other, and each standard cell includes at least one NMOS transistor and at least one least one PMOS transistor located in and on a silicon-on-insulator substrate. The at least one PMOS transistor of the first standard cell has a channel including silicon and germanium. The at least one PMOS transistor of each second standard cell has a silicon channel and a threshold voltage different in absolute value from the threshold voltage of said at least one PMOS transistor of the first cell.
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公开(公告)号:US20240105730A1
公开(公告)日:2024-03-28
申请号:US18532984
申请日:2023-12-07
Inventor: Olivier WEBER , Christophe LECOCQ
IPC: H01L27/12 , H01L21/8238 , H01L21/84 , H01L27/02 , H01L27/092
CPC classification number: H01L27/1203 , H01L21/823807 , H01L21/84 , H01L27/0207 , H01L27/092
Abstract: An integrated circuit includes at least a first standard cell framed by two second standard cells. The three cells are disposed adjacent to each other, and each standard cell includes at least one NMOS transistor and at least one least one PMOS transistor located in and on a silicon-on-insulator substrate. The at least one PMOS transistor of the first standard cell has a channel including silicon and germanium. The at least one PMOS transistor of each second standard cell has a silicon channel and a threshold voltage different in absolute value from the threshold voltage of said at least one PMOS transistor of the first cell.
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公开(公告)号:US20230051672A1
公开(公告)日:2023-02-16
申请号:US17861458
申请日:2022-07-11
Inventor: Harsh RAWAT , Praveen Kumar VERMA , Promod KUMAR , Christophe LECOCQ
Abstract: A memory circuit includes an array of memory cells arranged with first word lines connected to a first sub-array storing less significant bits of data and second word lines connected to a second sub-array storing more significant bits of data. A row decoder circuit coupled to the first and second word lines generates word line signals. A word line gating circuit is configured to selectively gate passage of the word line signals to the second word lines for the second sub-array in response to assertion of a maximum value signal. A data modification circuit performs a mathematical operation on data read from the array of memory cells, and asserts the maximum value signal if the mathematical operation performed on the less significant bits of data from the first sub-array produces a maximum data value.
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