公开(公告)号：US06901546B2

公开(公告)日：2005-05-31

申请号：US09876753

申请日：2001-06-07

申请人： Sam Gat-Shang Chu ,  Joachim Gerhard Clabes ,  Michael Normand Goulet ,  Johnny J. Leblanc ,  James Douglas Warnock

发明人： Sam Gat-Shang Chu ,  Joachim Gerhard Clabes ,  Michael Normand Goulet ,  Johnny J. Leblanc ,  James Douglas Warnock

IPC分类号： G01R31/317 ,  G01R31/3185 ,  G01R31/3187 ,  G06F11/27 ,  G01R31/28 ,  G06R11/00

CPC分类号： G01R31/3187 ,  G01R31/31705 ,  G01R31/318502 ,  G06F11/27

摘要： A device for fault testing in a microprocessor chip provides a LBIST circuit which has a first reference signature. A loading unit is further provided for receiving and outputting a set of masking data. A file unit connected to the loading unit is yet further provided for receiving the masking data. A masking unit connected to the file unit is yet further provided for generating a second reference signature based on the masking data from the file unit and a scanning data from a scan string in the chip. And, a signature logic connected to the output of the masking unit is yet further provided for compressing the second reference signature and inputting the compressed second reference signature to the LBIST circuit, wherein the compressed second reference signature replaces the first reference signature.

摘要翻译： 用于微处理器芯片中的故障测试的装置提供具有第一参考标识的LBIST电路。 进一步提供加载单元，用于接收和输出一组屏蔽数据。 还提供连接到加载单元的文件单元用于接收掩蔽数据。 还提供连接到文件单元的掩蔽单元，用于基于来自文件单元的掩蔽数据和来自芯片中的扫描串的扫描数据来生成第二参考签名。 并且，还提供连接到屏蔽单元的输出的签名逻辑，用于压缩第二参考签名并将压缩的第二参考签名输入到LBIST电路，其中压缩的第二参考签名替换第一参考签名。