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公开(公告)号：US20150185158A1
公开(公告)日：2015-07-02
申请号：US14282917
申请日：2014-05-20
Applicant: Samsung Display Co., Ltd.
Inventor： Ho LIM , Tae-Min Kim
CPC classification number: G01N21/77 , G01N21/643 , G01N21/75 , G01N23/2273 , G01N2021/6439 , G01N2021/755
Abstract: A method for measuring a reaction rate of a reactive mesogen and an alignment layer formed thereby, the method including coating an alignment material on a substrate. The alignment material includes a backbone and a reactive mesogen connected to the backbone. The reactive mesogen includes an unsaturated bond. The alignment material is irradiated with ultraviolet light, or is heated, to form the alignment layer. A marking compound, including a thiol group is coated on the alignment layer and reacts with remaining unreacted reactive mesogen, to form a marked mesogen. An amount of the marked mesogen is detected. A reactive ratio is measured by comparing an amount of the reactive mesogen before irradiating or heating with an amount of the marked mesogen.
Abstract translation: 一种用于测量由此形成的反应性液晶元和取向层的反应速率的方法，所述方法包括在基板上涂布取向材料。 取向材料包括主链和连接到主链的反应性液晶。 反应性液晶元包括不饱和键。 对准材料用紫外线照射或加热，形成取向层。 包括硫醇基的标记化合物涂覆在取向层上并与剩余的未反应的反应性介晶反应，形成标记的介晶。 检测到一定量的标记的介晶。 通过将照射或加热之前的反应性介晶的量与标记的介晶的量进行比较来测量反应比。
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公开(公告)号：US09904113B2
公开(公告)日：2018-02-27
申请号：US14812177
申请日：2015-07-29
Applicant: Samsung Display Co., LTD.
Inventor： Ho Lim , Tae-Hoon Kim , Sung-Yi Kim , Tae-Min Kim
IPC: C09K19/00 , G02F1/1337 , C09K19/56 , C09K19/38
CPC classification number: G02F1/133723 , C09K19/3833 , C09K19/3838 , C09K19/56 , G02F1/133788 , G02F2001/133715 , G02F2001/133726 , Y10T428/10 , Y10T428/1023
Abstract: An alignment composition is presented that includes an alignment polymer and a reactive mesogen. The alignment polymer includes a polyimide backbone and a vertical alignment side chain combined with the polyimide backbone. The reactive mesogen may be represented by the formula M5-M1-M2-M3-M4 in which M1 represents a divalent organic group including an aromatic ring group, M2 represents M3 represents a single bond, —O—, —O—(CH2)a—O—, or —(CH2)a—O—, wherein “a” represents an integer of 1 to 20, M4 represents an alkenyl group or an alkynyl group having a carbon number of 2 to 20 an alkenylcarbonyl group having a carbon number of 3 to 20, an alkenylcarbonyloxy group having a carbon number of 3 to 20, a an oxotetrahydrofuryl group having —(C═CH2)— substituted for at least one —CH2—, or an epoxy group. M5 represents -M2-M3-M4 or -M3-M4.
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公开(公告)号：US09377410B2
公开(公告)日：2016-06-28
申请号：US14282917
申请日：2014-05-20
Applicant: Samsung Display Co., Ltd.
Inventor： Ho Lim , Tae-Min Kim
CPC classification number: G01N21/77 , G01N21/643 , G01N21/75 , G01N23/2273 , G01N2021/6439 , G01N2021/755
Abstract: A method for measuring a reaction rate of a reactive mesogen and an alignment layer formed thereby, the method including coating an alignment material on a substrate. The alignment material includes a backbone and a reactive mesogen connected to the backbone. The reactive mesogen includes an unsaturated bond. The alignment material is irradiated with ultraviolet light, or is heated, to form the alignment layer. A marking compound, including a thiol group is coated on the alignment layer and reacts with remaining unreacted reactive mesogen, to form a marked mesogen. An amount of the marked mesogen is detected. A reactive ratio is measured by comparing an amount of the reactive mesogen before irradiating or heating with an amount of the marked mesogen.
Abstract translation: 一种用于测量由此形成的反应性液晶元和取向层的反应速率的方法，所述方法包括在基板上涂布取向材料。 取向材料包括主链和连接到主链的反应性液晶。 反应性液晶元包括不饱和键。 对准材料用紫外线照射或加热，形成取向层。 包括硫醇基的标记化合物涂覆在取向层上并与剩余的未反应的反应性介晶反应，形成标记的介晶。 检测到一定量的标记的介晶。 通过将照射或加热之前的反应性介晶的量与标记的介晶的量进行比较来测量反应比。
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