公开(公告)号：US20160111169A1

公开(公告)日：2016-04-21

申请号：US14881579

申请日：2015-10-13

Applicant: Samsung Electronics Co., Ltd.

Inventor： Min-woo Kim ,  Chang-ho Lee ,  Chang-yong Park ,  Bo-won Han

IPC: G11C29/12

CPC classification number: G11C29/12005 ,  G11C29/12015 ,  G11C29/26 ,  G11C29/56 ,  G11C2029/2602

Abstract: A memory test apparatus includes a test board unit including a first test board configured to load for testing a first memory system including a plurality of memory modules. A second test board is configured to load for testing a second memory system including a plurality of memory modules. A power unit comprises a first power supply unit configured to supply the first test board with a first power for testing the first memory system, a second power supply unit configured to supply the second test board with a second power for testing the second memory system, and a power supply control unit configured to control at least one of a supply timing of the first power and a supply timing of the second power.

Abstract translation: 存储器测试装置包括测试板单元，其包括被配置为加载用于测试包括多个存储器模块的第一存储器系统的第一测试板。 第二测试板被配置为加载用于测试包括多个存储器模块的第二存储器系统。 电源单元包括：第一电源单元，被配置为向第一测试板提供用于测试第一存储器系统的第一电源;第二电源单元，被配置为向第二测试板提供用于测试第二存储器系统的第二电源， 以及电源控制单元，被配置为控制第一功率的供给定时和第二功率的供给定时中的至少一个。