公开(公告)号：US12158495B2

公开(公告)日：2024-12-03

申请号：US17966456

申请日：2022-10-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hangseok Choi ,  Sangwoo Kang ,  Kwangyoon Lee ,  Chuleun Yun ,  Cheolha Yun

IPC: G01R31/28 ,  G01R27/28 ,  H02J4/00 ,  H03K17/082

Abstract: A method and an apparatus for diagnosing an electronic apparatus are provided. The device for diagnosing an electronic device includes a master diagnosis block that generates a control signal when a diagnosis mode is started, a multiplexer that sequentially outputs a diagnosis power through a diagnosis power path based on the control signal, a slave diagnosis block that is sequentially supplied the diagnosis power through the diagnosis power path and generates diagnosis data of a power management circuit of the electronic device by using the diagnosis power, a modulator that transmits the diagnosis data by modulating a power signal of the diagnosis power path, and a demodulator that receives the diagnosis data by demodulating the power signal of the diagnosis power path and provides the diagnosis data to the master diagnosis block.