公开(公告)号：US20250103787A1

公开(公告)日：2025-03-27

申请号：US18824006

申请日：2024-09-04

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dongsu LEE ,  Wontae JEONG ,  Sungcheol PARK

IPC: G06F30/3953

Abstract: A routing method for an integrated circuit includes selecting design for testing (DFT) instances targeted by routing, routing positions respectively corresponding to the DFT instances, generating routing sequences for the DFT instances, deriving a start point and an end point based on indices included in each of the routing sequences, calculating a distance between the start point and the end point, and selecting a routing sequence as a result of the calculating of the distance.