公开(公告)号：US20230047664A1

公开(公告)日：2023-02-16

申请号：US17691290

申请日：2022-03-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Shinki JEONG ,  Hyungsun RYU ,  Seongkwan LEE ,  Jaemoo CHOI

IPC: H04N17/00 ,  H04N5/374

Abstract: A testing system for testing an image sensor, includes a probe card, a pogo block receiving output signals of the probe card, an interface board configured to receive output signals of the pogo block, convert the received output signals of the pogo block, and output the converted signals through a cable, and a testing apparatus connected to the interface board through the cable. The testing apparatus is configured to test the device under test through signals received through the cable. The interface board includes an active interface module configured to amplify the received output signals of the pogo block, convert the amplified signals into signals having a same frequency as the received output signals of the pogo block, and transmit the converted signals to the cable.