公开(公告)号：US20180132806A1

公开(公告)日：2018-05-17

申请号：US15730616

申请日：2017-10-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Won Jun Choi ,  Jung Min Kim ,  Jae Won Yoo ,  Jae Wook Lee ,  Hyun Ho Choi

IPC: A61B6/00 ,  A61B6/10

CPC classification number: A61B6/4283 ,  A61B6/102 ,  A61B6/4233 ,  A61B6/4441 ,  A61B6/4464 ,  G01T1/00 ,  G01T1/2018

Abstract: Disclosed herein is an X-ray detector having impact resistance and an X-ray imaging apparatus including the same. The X-ray imaging apparatus includes an X-ray source configured to generate X-rays and emit the generated X-rays and an X-rays detector configured to detect the X-rays emitted by the X-ray source. The X-ray detector includes a main body, a sensor panel disposed in the main body to convert the X-rays emitted by the X-ray source into electrical signals, a middle block disposed in the main body to support the sensor panel and a buffer member extending between the main body and the middle block and having at least one bent portion.