APPARATUS FOR ANALYZING THIN FILM
    2.
    发明申请
    APPARATUS FOR ANALYZING THIN FILM 审中-公开
    分析薄膜的装置

    公开(公告)号:US20160178541A1

    公开(公告)日:2016-06-23

    申请号:US14972879

    申请日:2015-12-17

    CPC classification number: G01N23/20075 G01N2223/204 G01N2223/308

    Abstract: An apparatus analyzes a thin film having multiple layers. The apparatus includes an X-ray generator, a detector, and a signal processor. The X-ray generator radiates multi-wavelength X-rays sequentially onto a substrate stacked with the multi-layer thin film. The detector detects the multi-wavelength X-rays reflected from the substrate. The signal processor analyzes the multi-wavelength X-rays detected in the detector to determine a thickness of the multi-layer thin film.

    Abstract translation: 一种装置分析具有多层的薄膜。 该装置包括X射线发生器,检测器和信号处理器。 X射线发生器将多波长X射线顺序地辐射到层叠有多层薄膜的基板上。 检测器检测从基板反射的多波长X射线。 信号处理器分析在检测器中检测的多波长X射线以确定多层薄膜的厚度。

    METHOD AND APPARATUS WITH CROSSTALK CORRECTION

    公开(公告)号:US20220075183A1

    公开(公告)日:2022-03-10

    申请号:US17225339

    申请日:2021-04-08

    Abstract: A processor-implemented method with crosstalk correction includes: determining a region in which a crosstalk is to occur based on a three-dimensional (3D) position relationship between a position of eyes of a user and a position of a virtual image of a virtual content object; generating a concealer image for correcting the region in which the crosstalk is to occur based on the determined region and the virtual content object; and correcting the crosstalk by combining the virtual content object and the generated concealer image.

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