-
公开(公告)号:US20130083309A1
公开(公告)日:2013-04-04
申请号:US13685032
申请日:2012-11-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyun Jung Shim , Jae Young Sim , Do Kyoon Kim , Jeong Hwan Ahn , Alexander Hornung , Markus Gross , Rolf Adelsberger
IPC: G01C3/08
Abstract: An apparatus and method of correcting an image are provided. The apparatus includes a receiver to receive a depth value and a luminous intensity, the depth value and the luminous intensity being measured by at least one depth sensor, and a correction unit to read a correction depth value of a plurality of correction depth values mapped to different depth values and different luminous intensities from a first storage unit and to correct the measured depth value using the read correction depth value, the correction depth value being mapped to the measured depth value and the measured luminous intensity.
Abstract translation: 提供了一种校正图像的装置和方法。 该装置包括:接收器,用于接收由至少一个深度传感器测量的深度值和发光强度,深度值和发光强度;以及校正单元,用于读取映射到多个校正深度值的校正深度值 不同的深度值和来自第一存储单元的不同的发光强度,并且使用读取的校正深度值来校正测量的深度值,校正深度值被映射到测量的深度值和测量的发光强度。
-
公开(公告)号:US08743349B2
公开(公告)日:2014-06-03
申请号:US13685032
申请日:2012-11-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyun Jung Shim , Jae Young Sim , Do Kyoon Kim , Jeong Hwan Ahn , Alexander Hornung , Markus Gross , Rolf Adelsberger
IPC: G01C3/08
Abstract: An apparatus and method of correcting an image are provided. The apparatus includes a receiver to receive a depth value and a luminous intensity, the depth value and the luminous intensity being measured by at least one depth sensor, and a correction unit to read a correction depth value of a plurality of correction depth values mapped to different depth values and different luminous intensities from a first storage unit and to correct the measured depth value using the read correction depth value, the correction depth value being mapped to the measured depth value and the measured luminous intensity.
Abstract translation: 提供了一种校正图像的装置和方法。 该装置包括:接收器,用于接收由至少一个深度传感器测量的深度值和发光强度,深度值和发光强度;以及校正单元,用于读取映射到多个校正深度值的校正深度值 不同的深度值和来自第一存储单元的不同的发光强度,并且使用读取的校正深度值来校正测量的深度值,校正深度值被映射到测量的深度值和测量的发光强度。
-