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公开(公告)号:US11372322B2
公开(公告)日:2022-06-28
申请号:US17142704
申请日:2021-01-06
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ho Yeon Kim , Seong Chui Hong , Seong Sue Kim
Abstract: An extreme ultraviolet (EUV) mask blank is provided. The EUV mask blank includes a substrate having a first surface and a second surface opposed to each other, a reflective layer having first reflective layers and second reflective layers alternately stacked on the first surface of the substrate, a capping layer on the reflective layer, and a hydrogen absorber layer between the reflective layer and the capping layer, the hydrogen absorber layer configured to store hydrogen and being in contact with the capping layer.
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公开(公告)号:US10915015B2
公开(公告)日:2021-02-09
申请号:US16225915
申请日:2018-12-19
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ho Yeon Kim , Seong Chul Hong , Seong Sue Kim
Abstract: An extreme ultraviolet (EUV) mask blank is provided. The EUV mask blank includes a substrate having a first surface and a second surface opposed to each other, a reflective layer having first reflective layers and second reflective layers alternately stacked on the first surface of the substrate, a capping layer on the reflective layer, and a hydrogen absorber layer between the reflective layer and the capping layer, the hydrogen absorber layer configured to store hydrogen and being in contact with the capping layer.
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公开(公告)号:US10338477B2
公开(公告)日:2019-07-02
申请号:US15674129
申请日:2017-08-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Do Hyung Kim , Seong Sue Kim
Abstract: A lithography apparatus is provided. The lithography apparatus a reticle having a first surface and a second surface facing each other, and a pattern region formed on the first surface, a reticle stage facing the second surface of the reticle, the reticle stage to chuck the reticle, a protection conductor within a chamber housing the reticle and the reticle stage; and a power source to supply a voltage to the protection conductor.
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