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公开(公告)号:US20240319593A1
公开(公告)日:2024-09-26
申请号:US18381335
申请日:2023-10-18
发明人: Yool Kang , Taehui Kwon , Dongjun Kim , Ahram Suh , Miyeon Jung , Samjong Choi , Ohhwan Kweon , Minki Kim , Jaehyun Kim , Sunggun Shin , Seungryul Yoo , Heekyung Lee
CPC分类号: G03F7/0048 , G03F7/2004
摘要: Provided are a thinner composition, which may be generally used for an extreme ultraviolet (EUV) photoresist as well as KrF and ArF photoresists and exhibits improved performance in reduced resist coating (RRC) and edge bead removal (EBR), and which has an excellent pipe cleaning capability, and a method of treating a substrate surface by using the thinner composition. The thinner composition includes a C2-C4 alkylene glycol C1-C4 alkyl ether acetate, a C2-C3 alkylene glycol C1-C4 alkyl ether, and a cycloketone.