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1.
公开(公告)号:US20230288795A1
公开(公告)日:2023-09-14
申请号:US18052026
申请日:2022-11-02
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sung-Hwan BAE , Se Jin PARK
CPC classification number: G03F1/36 , G03F1/44 , G03F1/70 , G03F7/70525
Abstract: A method of fabricating a mask by performing optical proximity correction (OPC) is provided, The method of fabricating a mask includes generating a target curve by using bias control points, extracting a first contour of an initial design mask by performing an OPC process, generating a first updated design mask, which is obtained by updating the initial design mask, by using the first contour and the target curve, extracting a second contour of the first updated design mask by performing the OPC process, and generating a second updated design mask by using the second contour and the target curve
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公开(公告)号:US20250156113A1
公开(公告)日:2025-05-15
申请号:US18635752
申请日:2024-04-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jangkwon LEE , Sun-Dong KIM , Hyunjoo JUNG , Sung-Hwan BAE
IPC: G06F3/06
Abstract: Disclosed is an operating method of a storage device which includes a non-volatile memory device and a storage controller. The method includes providing, by the storage controller, the non-volatile memory device with a first command indicating a target memory operation of user data, performing, by the non-volatile memory device, the target memory operation in a memory region based on the first command and first setting information stored in an E-fuse region, providing, by the non-volatile memory device, the storage controller with a first response indicating that the target memory operation fails, providing, by the storage controller, the non-volatile memory device with a second command indicating an initialization operation of the E-fuse region based on the first response, updating, by the non-volatile memory device, the first setting information of the E-fuse region based on the second command, so as to be changed to second setting information.
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