公开(公告)号：US09554762B2

公开(公告)日：2017-01-31

申请号：US14301820

申请日：2014-06-11

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Tae-kyun Kim ,  Sung-nam Kim ,  Jae-chool Lee

IPC: A61B6/00 ,  A61B6/06 ,  A61B5/00 ,  A61B6/03 ,  A61B6/04 ,  A61B5/055

CPC classification number: A61B6/48 ,  A61B5/0037 ,  A61B5/055 ,  A61B6/03 ,  A61B6/0457 ,  A61B6/06 ,  A61B6/465 ,  A61B6/469 ,  A61B6/488 ,  A61B6/5241 ,  A61B6/545

Abstract: A method of obtaining an X-ray image, the method including: obtaining a first image of an object; receiving a determination whether the first image includes an entirety of a region of interest (ROI); and obtaining a second image of the object, the second image including a portion of the ROI which is absent in the first image.

Abstract translation: 一种获得X射线图像的方法，所述方法包括：获得对象的第一图像; 接收确定所述第一图像是否包括感兴趣区域（ROI）的整体; 以及获得所述对象的第二图像，所述第二图像包括在所述第一图像中不存在的ROI的一部分。

公开(公告)号：US10380718B2

公开(公告)日：2019-08-13

申请号：US15155758

申请日：2016-05-16

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hee-yeon Moon ,  Sung-nam Kim ,  Byeong-won Lee

IPC: G06K9/00 ,  G06T3/40 ,  A61B6/00 ,  G06T3/20 ,  G06T7/32

Abstract: A method of displaying a medical image includes: obtaining a first image and a second image that are images of an object captured by using an X-ray; generating a synthesis image by overlapping a first overlapped region of the first image and a second overlapped region of the second image; obtaining information about synthesis accuracy representing a degree to which overlapped portions of the object represented by the first overlapped region and the second overlapped region coincide with each other; and displaying the information about the synthesis accuracy and the synthesis image together.