公开(公告)号：US10132865B2

公开(公告)日：2018-11-20

申请号：US15170940

申请日：2016-06-01

Applicant: Samsung Electronics Co., Ltd.

Inventor： Seon-kyoo Lee ,  Jeong-don Ihm ,  Byung-hoon Jeong ,  Dae-woon Kang ,  Tae-sung Lee ,  Sang-lok Kim

IPC: G01R31/28 ,  G01R31/3183 ,  G01R31/317

Abstract: A semiconductor chip, a test system, and a method of testing the semiconductor chip. The semiconductor chip includes a pulse generator configured to generate a test pulse in response to a test request; a logic chain comprising a plurality of logic devices serially connected to each other and transferring the test pulse sequentially; and a detector configured to detect a logic level of an output signal of each of the logic devices and output a detection result indicating a degree of an inter-symbol interference (ISI).