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公开(公告)号:US11190605B2
公开(公告)日:2021-11-30
申请号:US15653231
申请日:2017-07-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kwang-Min Kim , Jong-Chang Lee , Won-Joo Park , Hyun-Sik Shim , Young-Hee Park , Moon-Sang Lee , Min-Soo Koo , Seung-Hyun Yoon , Ji-In Nam
Abstract: A system and method for connecting devices includes receiving from a first device a request to follow a second device, and setting a following relationship between the first device and the second device in response to the request.
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公开(公告)号:US09892500B2
公开(公告)日:2018-02-13
申请号:US14710872
申请日:2015-05-13
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyung-Joo Lee , Won-Joo Park , Seuk-Hwan Choi , Byung-Gook Kim , Dong-Hoon Chung
CPC classification number: G06T7/0004 , G05B2219/45027 , G06T2207/10061 , G06T2207/30148
Abstract: A method for measuring a critical dimension of a mask pattern, including generating a mask pattern using an optically proximity-corrected (OPC) mask design including at least one block; measuring a first critical dimension of a target-region of interest (target-ROI) including neighboring blocks having a same critical dimension (CD), in the mask pattern; determining a group region of interest including the target-ROI and at least one neighboring block adjacent to the target-ROI; measuring second CDs of the neighboring blocks of the group region of interest; and correcting a measuring value of the first CD using a measuring value of the second CDs.
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公开(公告)号:US20170318106A1
公开(公告)日:2017-11-02
申请号:US15653231
申请日:2017-07-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kwang-Min Kim , Jong-Chang Lee , Won-Joo Park , Hyun-Sik Shim , Young-Hee Park , Moon-Sang Lee , Min-Soo Koo , Seung-Hyun Yoon , Ji-In Nam
CPC classification number: H04L67/24 , H04L12/2825 , H04L67/025
Abstract: A system and method for connecting devices includes receiving from a first device a request to follow a second device, and setting a following relationship between the first device and the second device in response to the request.
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