公开(公告)号：US20140241093A1

公开(公告)日：2014-08-28

申请号：US14077187

申请日：2013-11-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Woo-Jin LEE ,  Dae-Hyun KIM ,  Sang-Yun KIM ,  Jae-Sung KIM ,  Young-Soo SOHN

IPC: G11C7/00

CPC classification number: G11C11/40611 ,  G11C11/40622 ,  G11C29/028 ,  G11C29/50016

Abstract: A refresh address generator may include a lookup table including a first portion storing a first group of addresses associated with a first data retention time, and a second portion storing a second group of addresses associated with a second data retention time different from the first data retention time, wherein the addresses of the first portion are more frequently accessed than the addresses of the second portion to refresh the memory cells corresponding to the addresses. Systems and methods may also implement such refresh address generation.

Abstract translation: 刷新地址生成器可以包括查找表，其包括存储与第一数据保留时间相关联的第一组地址的第一部分，以及存储与第二数据保留时间相关联的第二组地址的第二部分，该第二组地址与第一数据保留不同 时间，其中第一部分的地址比第二部分的地址更频繁地访问以刷新对应于地址的存储单元。 系统和方法也可以实现这种刷新地址生成。

公开(公告)号：US20140032826A1

公开(公告)日：2014-01-30

申请号：US13941359

申请日：2013-07-12

Applicant: Samsung Electronics Co., Ltd.

Inventor： Woo-Jin LEE ,  Dae-Hyun KIM ,  Seung-Jun BAE ,  Young-Soo SOHN ,  Tae-Young OH

IPC: G06F12/00

CPC classification number: G06F12/00 ,  G06F9/4403 ,  G11C11/40 ,  G11C11/4072 ,  G11C29/028 ,  G11C2029/4402

Abstract: A method of training a memory device included in a memory system is provided. The method includes testing memory core parameters for a memory core of the memory device during a booting-up sequence of the memory system; determining trimmed memory core parameters based on the test results; storing the determined trimmed memory core parameters; and applying the trimmed memory core parameter to the memory device during a normal operation of the memory device.

Abstract translation: 提供了一种训练包括在存储器系统中的存储器件的方法。 该方法包括在存储器系统的引导序列期间测试存储器件的存储器核心的存储器核心参数; 根据测试结果确定修剪内存核心参数; 存储所确定的修整的存储器核心参数; 以及在存储器件的正常操作期间将修整的存储器核心参数应用于存储器件。