公开(公告)号：US09880781B2

公开(公告)日：2018-01-30

申请号：US15017984

申请日：2016-02-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yonggeun Oh ,  Dae-Ho Kim ,  Chul-Woo Lee ,  Gyucheol Han

IPC: G06F3/06 ,  G11C7/04 ,  G11C7/10 ,  G11C16/04

CPC classification number: G06F3/0653 ,  G06F3/0619 ,  G06F3/0679 ,  G11C7/04 ,  G11C7/1045 ,  G11C16/0483

Abstract: A storage device is provided which includes a nonvolatile memory and a temperature sensor. The temperature sensor is configured to detect a temperature of the storage device. The temperature sensor is configured to output temperature information. The storage device includes a memory controller. The memory controller is configured to access the nonvolatile memory in response to a request of an external host device. The memory controller is configured to obtain the temperature information from the temperature sensor according to a first period in a first mode. The temperature sensor is configured to obtain the temperature information from the temperature sensor according to a second period in a second mode. The second period is shorter than the first period.

公开(公告)号：US10170198B2

公开(公告)日：2019-01-01

申请号：US15092804

申请日：2016-04-07

Applicant: Samsung Electronics Co., Ltd.

Inventor： Pilchang Son ,  Soohwan Kang ,  Yonggeun Oh

IPC: H04L29/06 ,  G11C29/38 ,  G06F3/06 ,  G06F21/64 ,  G11C11/00 ,  H04L9/32 ,  G11C5/04 ,  G11C16/00 ,  G11C29/04

Abstract: A data storage may include at least one nonvolatile memory device and a controller operatively connected to the at least one nonvolatile memory device. The controller is configured to receive binary data from a host through a side-band interface. The controller is configured to execute the binary data according to a request from the host to execute a test operation. A test operation with respect to the data storage may be executed through a side-band interface.