摘要:
A latency circuit for use in a semiconductor memory device includes a latency control clock generator generating an m-divided division signal from an external clock and at least one latency control clock from the m-divided division signal, wherein m is a natural number greater than or equal to 2. The latency circuit also includes a latency signal generator generating a latency signal in response to the at least one latency control clock, a latency control signal and an internal read command signal, wherein the latency control signal is generated from a column address strobe (CAS) latency and the internal read command signal is generated in response to a received read command.