DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES

    公开(公告)号:US20240347084A1

    公开(公告)日:2024-10-17

    申请号:US18755033

    申请日:2024-06-26

    CPC classification number: G11C7/1096 G11C7/1069 G11C7/109 G11C7/222

    Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including initializing the memory device; selecting at least one sample management unit on the memory device; performing a calibration operation on the sample management unit to determine a duration value reflecting a duration during which the memory device was powered down; adjusting an accumulator value based on the duration value; determining a read voltage value based on the accumulator value; and performing a read operation using the read voltage value.

    Semiconductor system for performing a duty ratio adjustment operation

    公开(公告)号:US12119082B2

    公开(公告)日:2024-10-15

    申请号:US17968374

    申请日:2022-10-18

    Applicant: SK hynix Inc.

    CPC classification number: G11C7/222 G11C7/225 G11C2207/2254 G11C2207/2281

    Abstract: A semiconductor system includes a first semiconductor device configured to output a clock and pattern data, configured to receive a strobe signal and output data, and configured to adjust a duty ratio of the strobe signal by comparing odd data and even data that are generated from the output data and the pattern data, in synchronization with the strobe signal and a second semiconductor device configured to store the pattern data in synchronization with the clock, configured to output the clock as the strobe signal by adjusting a duty ratio of the clock, and configured to output the stored pattern data as the output data.

    MEMORY DEVICE, READ CLOCK GENERATION CIRCUIT, AND METHOD FOR CONTROLLING READ OPERATION IN MEMORY DEVICE

    公开(公告)号:US20240339140A1

    公开(公告)日:2024-10-10

    申请号:US18297094

    申请日:2023-04-07

    CPC classification number: G11C7/222 G11C7/08 G11C7/12

    Abstract: The present disclosure provides a memory device, which includes a memory array, a read-clock generation circuit, and a local input/output circuit. The read-clock generation circuit receives a sense amplifier enable signal, a first sense amplifier pre-charge signal, and a latched write enable signal to generate a first read enable signal. The local input/output circuit includes multiple pairs of column-address pass gates, and a pair of read pass gates. The plurality of pairs of column-address pass gates are configured to receive data from a bit-line pair of the memory cells in a row selected by an address signal. The pair of read pass gates connects a read bit-line pair to the bit-line pair in response to the first read enable signal being in a low-logic state. The first read enable signal is de-asserted after the read bit-line pair connected to the pair of read pass gates are pre-charged.

    Apparatuses and methods for accurate bias temperature instability mitigation

    公开(公告)号:US12094560B2

    公开(公告)日:2024-09-17

    申请号:US17812102

    申请日:2022-07-12

    Inventor: Huipeng Ba Yuan He

    CPC classification number: G11C7/04 G11C7/222

    Abstract: Apparatuses, systems, and methods for accurate bias temperature instability (BTI) mitigation. During a first period a signal is provided to a path of a device, and during a second period a BTI toggle signal is provided to the path. During the first period a ratio of the time that the signal is active or inactive is measured. During the second period the BTI toggle signal is provided with a duty cycle based on the measured ratio. The duty cycle may be higher if the measured ratio is lower and lower if the measured ratio was higher.

    Semiconductor device
    9.
    发明授权

    公开(公告)号:US12080379B2

    公开(公告)日:2024-09-03

    申请号:US17939016

    申请日:2022-09-07

    CPC classification number: G11C7/222 G11C7/06 G11C7/1096

    Abstract: A semiconductor device according to an embodiment includes a plurality of sampler circuits configured to receive a plurality of offset clock signals or a plurality of divided clock signals and to sample a data signal in response to each of a plurality of divided clock signals. A calibration circuit applies a first offset clock signal to a first sampler circuit, applies a second offset clock signal having an opposite phase to the first offset clock signal to a second sampler circuit, and generates a first offset adjustment signal for adjusting an offset of the first sampler circuit based on an output of the first sampler circuit that is output in response to the first offset clock signal.

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