公开(公告)号：US09478237B2

公开(公告)日：2016-10-25

申请号：US14030412

申请日：2013-09-18

Applicant: Seagate Technology LLC

Inventor： Leping Li ,  Jeffrey Robert O'Konski ,  Saravuth Keo ,  Pramit P. Parikh

IPC: G01R31/00 ,  G11B5/31

CPC classification number: G11B5/3169

Abstract: A data storage device may be tested during or after manufacture by a testing device that may have at least a work piece with at least one contact pad concurrently contacting bottom and sidewall surfaces of a probe tip with a centering feature of the at least one contact pad.

Abstract translation: 数据存储装置可以在制造期间或之后由测试装置进行测试，该测试装置可以具有至少一个工件，其中至少一个接触垫同时与探针尖端的底部和侧壁表面接触，并具有至少一个接触垫的定中心特征 。

公开(公告)号：US20150077148A1

公开(公告)日：2015-03-19

申请号：US14030412

申请日：2013-09-18

Applicant: Seagate Technology LLC

Inventor： Leping Li ,  Jeffrey Robert O'Konski ,  Saravuth Keo ,  Pramit P. Parikh

IPC: G11B5/455

CPC classification number: G11B5/3169

Abstract: A data storage device may be tested during or after manufacture by a testing device that may have at least a work piece with at least one contact pad concurrently contacting bottom and sidewall surfaces of a probe tip with a centering feature of the at least one contact pad.

Abstract translation: 数据存储装置可以在制造期间或之后由测试装置进行测试，该测试装置可以具有至少一个工件，其中至少一个接触垫同时与探针尖端的底部和侧壁表面接触，并具有至少一个接触垫的定中心特征 。