TEST APPARATUS
    1.
    发明申请
    TEST APPARATUS 审中-公开
    测试仪器

    公开(公告)号:US20120153977A1

    公开(公告)日:2012-06-21

    申请号:US13292091

    申请日:2011-11-09

    申请人: Seiji AMANUMA

    发明人: Seiji AMANUMA

    IPC分类号: G01R31/26

    CPC分类号: G01R31/2637 G01R31/261

    摘要: To prevent an excessive current from flowing through a device under test. A test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path leading from the power supply section to the device under test; a first semiconductor switch that is provided in the path leading from the inductive load section to the device under test and is connected in parallel with the device under test; and a control section that turns the first semiconductor switch ON when supply of the power supply voltage to the device under test is stopped.

    摘要翻译: 防止过电流流过被测设备。 一种测试被测设备的测试装置,包括:电源部分,产生供应给被测设备的电源电压; 电感负载部,其设置在从供电部到被测设备的路径中; 第一半导体开关,其设置在从感性负载部分引导到被测器件的路径中,并与待测器件并联连接; 以及控制部,其在向被测试装置供给电源电压时,使第一半导体开关接通。

    TEST APPARATUS AND POWER SUPPLY APPARATUS
    2.
    发明申请
    TEST APPARATUS AND POWER SUPPLY APPARATUS 有权
    测试装置和电源设备

    公开(公告)号:US20110128020A1

    公开(公告)日:2011-06-02

    申请号:US12861695

    申请日:2010-08-23

    申请人: Seiji AMANUMA

    发明人: Seiji AMANUMA

    IPC分类号: G01R31/00

    摘要: Provided is a test apparatus that tests a device under test, comprising a plurality of capacitors that are each charged to a predetermined voltage; a switching section that switches which of the capacitors charged to a predetermined voltage supplies power to the device under test; and a judging section that judges acceptability of the device under test based on an operational result of the device under test. Also provided is a test apparatus that selects one of a plurality of capacitors and a corresponding one of a plurality of power supply units, according to content of a test performed after a test that uses another of the capacitors to supply power to the device under test.

    摘要翻译: 提供了一种测试被测设备的测试装置,包括多个电容器,每个电容器被充电到预定电压; 开关部,其将被充电至预定电压的电容器切换到被测设备; 以及判断部,根据被测设备的运行结果来判断被测设备的可接受性。 还提供了一种测试装置,其根据在使用另一个电容器向被测试器件供电的测试之后进行的测试的内容,选择多个电容器中的一个和多个电源单元中的一个电源单元中的一个 。

    SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS
    3.
    发明申请
    SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS 审中-公开
    开关电路,信号输出装置和测试装置

    公开(公告)号:US20080238213A1

    公开(公告)日:2008-10-02

    申请号:US11766799

    申请日:2007-06-22

    申请人: Seiji AMANUMA

    发明人: Seiji AMANUMA

    IPC分类号: H03K17/00

    摘要: There is provided a switching circuit that opens or short-circuits between a first terminal and a second terminal in accordance with a control signal. The switching circuit includes a plurality of switching devices that is serially connected between the first terminal and the second terminal and each of which is opened or short-circuited in accordance with a provided control voltage, and a plurality of control circuits that is provided one-to-one corresponding to the plurality of switching devices, each of which provides a control voltage according to the control signal to the corresponding switching device, and that opens and short-circuits the plurality of switching devices in synchronization with each other.

    摘要翻译: 提供了根据控制信号在第一端子和第二端子之间断开或短路的开关电路。 开关电路包括串联连接在第一端子和第二端子之间的多个开关装置,其中每个开关装置根据所提供的控制电压而断开或短路;以及多个控制电路, 一对应于多个开关装置,每个开关装置根据控制信号向相应的开关装置提供控制电压,并且使多个开关装置彼此同步地打开和短路。