公开(公告)号：US20120217985A1

公开(公告)日：2012-08-30

申请号：US13215184

申请日：2011-08-22

申请人： Seiji Amanuma

发明人： Seiji Amanuma

IPC分类号： G01R31/00

CPC分类号： G01R31/2607

摘要： There is provided a test apparatus that is capable of applying, to a device under test, a current that rises within a short period. A test apparatus for testing a device under test, includes a current source that supplies the device under test with a current, a dummy load that has an electrical characteristic corresponding to an electrical characteristic of the device under test, and a switching section that switches whether the current source is connected to the dummy load or the device under test. Here, after connecting the current source to the dummy load, the switching section disconnects the current source from the dummy load and connects the current source to the device under test when a voltage applied to the dummy load reaches a voltage within a predetermined range.

摘要翻译： 提供了一种测试装置，其能够将被测设备应用于在短时间内上升的电流。 一种用于测试被测器件的测试装置，包括一个电流源，用于向受测试器件供电，具有与被测器件的电气特性对应的电特性的虚拟负载，以及切换器件是否切换 电流源连接到虚拟负载或被测设备。 这里，在将电流源连接到虚拟负载之后，切换部分将电流源与虚拟负载断开，并且当施加到虚拟负载的电压达到预定范围内的电压时，将电流源连接到被测器件。

公开(公告)号：US07550976B2

公开(公告)日：2009-06-23

申请号：US11710237

申请日：2007-02-23

申请人： Seiji Amanuma

发明人： Seiji Amanuma

IPC分类号： G01R31/04 ,  G01R31/02 ,  G01R27/08

CPC分类号： G01R31/2837 ,  G01R15/22 ,  G01R31/2607

摘要： A measurement apparatus is provided for measuring at least one of the switching times of the output signals output from a device under test. The measurement apparatus comprises: a first light-emitting unit having a function whereby light emission starts in a case that the voltage of the output signal becomes equal to or greater than a first threshold voltage; a second light-emitting unit having a function whereby light emission starts in a case that the voltage of the output signal becomes equal to or greater than a second threshold voltage that is higher than the first threshold voltage; a first light reception unit which receives light emitted from the first light-emitting unit; a second light reception unit which receives light emitted from the second light-emitting unit; and a measurement unit which measures the switching time required for the voltage to switch between the first threshold voltage and the second threshold voltage, based upon at least one of the difference in the light-emission start timing and the difference in the light-emission stop timing between the first light-emitting unit and the second light-emitting unit.

摘要翻译： 提供了一种测量装置，用于测量从被测器件输出的输出信号的切换时间中的至少一个。 测量装置包括：第一发光单元，具有在输出信号的电压变为等于或大于第一阈值电压的情况下开始发光的功能; 第二发光单元具有在输出信号的电压变得等于或大于高于第一阈值电压的第二阈值电压的情况下开始发光的功能; 第一光接收单元，其接收从第一发光单元发射的光; 第二光接收单元，其接收从所述第二发光单元发射的光; 以及测量单元，其基于发光开始定时和发光停止的差异中的至少一个来测量电压在第一阈值电压和第二阈值电压之间切换所需的开关时间 第一发光单元和第二发光单元之间的时序。

公开(公告)号：US20070210823A1

公开(公告)日：2007-09-13

申请号：US11710237

申请日：2007-02-23

申请人： Seiji Amanuma

发明人： Seiji Amanuma

IPC分类号： G01R31/00

CPC分类号： G01R31/2837 ,  G01R15/22 ,  G01R31/2607

摘要： A measurement apparatus is provided for measuring at least one of the switching times of the output signals output from a device under test. The measurement apparatus comprises: a first light-emitting unit having a function whereby light emission starts in a case that the voltage of the output signal becomes equal to or greater than a first threshold voltage; a second light-emitting unit having a function whereby light emission starts in a case that the voltage of the output signal becomes equal to or greater than a second threshold voltage that is higher than the first threshold voltage; a first light reception unit which receives light emitted from the first light-emitting unit; a second light reception unit which receives light emitted from the second light-emitting unit; and a measurement unit which measures the switching time required for the voltage to switch between the first threshold voltage and the second threshold voltage, based upon at least one of the difference in the light-emission start timing and the difference in the light-emission stop timing between the first light-emitting unit and the second light-emitting unit.

摘要翻译： 提供了一种测量装置，用于测量从被测器件输出的输出信号的切换时间中的至少一个。 测量装置包括：第一发光单元，具有在输出信号的电压变为等于或大于第一阈值电压的情况下开始发光的功能; 第二发光单元具有在输出信号的电压变得等于或大于高于第一阈值电压的第二阈值电压的情况下开始发光的功能; 第一光接收单元，其接收从第一发光单元发射的光; 第二光接收单元，其接收从所述第二发光单元发射的光; 以及测量单元，其基于发光开始定时和发光停止的差异中的至少一个来测量电压在第一阈值电压和第二阈值电压之间切换所需的开关时间 第一发光单元和第二发光单元之间的时序。

公开(公告)号：US20070194795A1

公开(公告)日：2007-08-23

申请号：US11698773

申请日：2007-01-26

申请人： Seiji Amanuma ,  Ken-Ichiro Hatake

发明人： Seiji Amanuma ,  Ken-Ichiro Hatake

IPC分类号： G01R31/08

CPC分类号： G01R15/04 ,  G01R15/14

摘要： A test apparatus to test a device under test (DUT) to which a reference voltage of a predetermined high voltage is supplied is provided. The test apparatus includes a reference voltage applying section that applies the reference voltage to the DUT, wherein the reference voltage defines a voltage level that is to be possessed by an output signal output from the DUT when the output signal indicates a predetermined logical value, a voltage level detecting section that detects a voltage level of the reference voltage, a signal comparing section that compares the output signal with an expected value signal, a reference voltage comparing section that judges whether the voltage level of the reference voltage detected by the voltage level detecting section falls within a predetermined expected voltage range, and a judging section that judges whether the DUT is good or bad based on a result of the comparison done by the signal comparing section, under a condition that the voltage level of the reference voltage falls within the expected voltage range.

摘要翻译： 提供了一种用于测试供应有预定高电压的参考电压的被测器件（DUT）的测试装置。 该测试装置包括将参考电压施加到DUT的参考电压施加部分，其中参考电压定义当输出信号指示预定逻辑值时从DUT输出的输出信号将拥有的电压电平， 电压电平检测部，其检测基准电压的电压电平;信号比较部，其将输出信号与预期值信号进行比较;基准电压比较部，判断由电压电平检测检测到的基准电压的电压电平 所述判定部根据由所述信号比较部进行的比较的结果，在所述参考电压的电压水平位于所述电压范围内的条件下，判断所述DUT是良好还是坏的判定部 预期电压范围。

公开(公告)号：US09057756B2

公开(公告)日：2015-06-16

申请号：US13292091

申请日：2011-11-09

申请人： Seiji Amanuma

发明人： Seiji Amanuma

IPC分类号： G01R31/08 ,  G01R31/02 ,  G01R31/26

CPC分类号： G01R31/2637 ,  G01R31/261

摘要： To prevent an excessive current from flowing through a device under test. A test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path leading from the power supply section to the device under test; a first semiconductor switch that is provided in the path leading from the inductive load section to the device under test and is connected in parallel with the device under test; and a control section that turns the first semiconductor switch ON when supply of the power supply voltage to the device under test is stopped.

摘要翻译： 防止过电流流过被测设备。 一种测试被测设备的测试装置，包括：电源部分，产生供应给被测设备的电源电压; 电感负载部，其设置在从供电部到被测设备的路径中; 第一半导体开关，其设置在从感性负载部分引导到被测器件的路径中，并与待测器件并联连接; 以及控制部，其在向被测试装置供给电源电压时，使第一半导体开关接通。

公开(公告)号：US08427182B2

公开(公告)日：2013-04-23

申请号：US12861695

申请日：2010-08-23

申请人： Seiji Amanuma

发明人： Seiji Amanuma

IPC分类号： G01R31/00

CPC分类号： G01R31/2851 ,  G01R31/2839 ,  Y10T307/76

摘要： Provided is a test apparatus that tests a device under test, comprising a plurality of capacitors that are each charged to a predetermined voltage; a switching section that switches which of the capacitors charged to a predetermined voltage supplies power to the device under test; and a judging section that judges acceptability of the device under test based on an operational result of the device under test. Also provided is a test apparatus that selects one of a plurality of capacitors and a corresponding one of a plurality of power supply units, according to content of a test performed after a test that uses another of the capacitors to supply power to the device under test.

摘要翻译： 提供了一种测试被测设备的测试装置，包括多个电容器，每个电容器被充电到预定电压; 开关部，其将被充电至预定电压的电容器切换到被测设备; 以及判断部，根据被测设备的运行结果来判断被测设备的可接受性。 还提供了一种测试装置，其根据在使用另一个电容器向被测试器件供电的测试之后进行的测试的内容，选择多个电容器中的一个和多个电源单元中的一个电源单元中的一个 。

公开(公告)号：US20100052435A1

公开(公告)日：2010-03-04

申请号：US12613370

申请日：2009-11-05

申请人： Seiji Amanuma

发明人： Seiji Amanuma

IPC分类号： H03K17/00

CPC分类号： H03K17/0412 ,  H03K17/04123 ,  H03K17/163 ,  H03K17/28 ,  H03K17/284 ,  H03K17/6871 ,  H03K17/6877 ,  Y10T307/747 ,  Y10T307/76 ,  Y10T307/964

摘要： A signal output device that outputs an output signal according to an input signal expressing a logical value that includes a high-voltage side switching circuit between a first terminal and a second terminal in accordance with a first control signal. The device includes a low-voltage side switching circuit between a first and second terminal for outputting a low-voltage side reference voltage in accordance with a second control signal and a control section. The high-voltage and low-voltage side switching circuits include a plurality of switching devices serially connected between the first terminal and the second terminal and each of which is opened in accordance with a provided control voltage. The control circuit opens the plurality of switching devices substantially in synchronization with each other, where a voltage inputted to the first terminal is outputted from the second terminal by short-circuiting between the first terminal and the second terminal.

摘要翻译： 一种信号输出装置，其根据第一控制信号，根据表示包括第一端子和第二端子之间的高压侧切换电路的逻辑值的输入信号输出输出信号。 该装置包括在第一和第二端子之间的低压侧切换电路，用于根据第二控制信号和控制部分输出低电压侧基准电压。 高压侧和低压侧切换电路具有串联连接在第一端子与第二端子之间的多个开关元件，其各自根据所提供的控制电压而断开。 控制电路基本上彼此同步地打开多个开关装置，其中通过第一端子和第二端子之间的短路从第二端子输出输入到第一端子的电压。

公开(公告)号：US09222966B2

公开(公告)日：2015-12-29

申请号：US13215184

申请日：2011-08-22

申请人： Seiji Amanuma

发明人： Seiji Amanuma

IPC分类号： G01R31/00 ,  G01R31/26

CPC分类号： G01R31/2607

摘要： There is provided a test apparatus that is capable of applying, to a device under test, a current that rises within a short period. A test apparatus for testing a device under test, includes a current source that supplies the device under test with a current, a dummy load that has an electrical characteristic corresponding to an electrical characteristic of the device under test, and a switching section that switches whether the current source is connected to the dummy load or the device under test. Here, after connecting the current source to the dummy load, the switching section disconnects the current source from the dummy load and connects the current source to the device under test when a voltage applied to the dummy load reaches a voltage within a predetermined range.

摘要翻译： 提供了一种测试装置，其能够将被测设备应用于在短时间内上升的电流。 一种用于测试被测器件的测试装置，包括一个电流源，用于向受测试器件供电，具有与被测器件的电气特性对应的电特性的虚拟负载，以及切换器件是否切换 电流源连接到虚拟负载或被测设备。 这里，在将电流源连接到虚拟负载之后，切换部分将电流源与虚拟负载断开，并且当施加到虚拟负载的电压达到预定范围内的电压时，将电流源连接到被测器件。

公开(公告)号：US07911086B2

公开(公告)日：2011-03-22

申请号：US12613370

申请日：2009-11-05

申请人： Seiji Amanuma

发明人： Seiji Amanuma

IPC分类号： H02B1/24 ,  H01H31/10 ,  H01H33/59 ,  H01H47/00 ,  H01H85/46 ,  H01H19/14

CPC分类号： H03K17/0412 ,  H03K17/04123 ,  H03K17/163 ,  H03K17/28 ,  H03K17/284 ,  H03K17/6871 ,  H03K17/6877 ,  Y10T307/747 ,  Y10T307/76 ,  Y10T307/964

摘要： A signal output device that outputs an output signal according to an input signal expressing a logical value that includes a high-voltage side switching circuit between a first terminal and a second terminal in accordance with a first control signal. The device includes a low-voltage side switching circuit between a first and second terminal for outputting a low-voltage side reference voltage in accordance with a second control signal and a control section. The high-voltage and low-voltage side switching circuits include a plurality of switching devices serially connected between the first terminal and the second terminal and each of which is opened in accordance with a provided control voltage. The control circuit opens the plurality of switching devices substantially in synchronization with each other, where a voltage inputted to the first terminal is outputted from the second terminal by short-circuiting between the first terminal and the second terminal.

摘要翻译： 一种信号输出装置，其根据第一控制信号，根据表示包括第一端子和第二端子之间的高压侧切换电路的逻辑值的输入信号输出输出信号。 该装置包括在第一和第二端子之间的低压侧切换电路，用于根据第二控制信号和控制部分输出低电压侧基准电压。 高压侧和低压侧切换电路具有串联连接在第一端子与第二端子之间的多个开关元件，其各自根据所提供的控制电压而断开。 控制电路基本上彼此同步地打开多个开关装置，其中通过第一端子和第二端子之间的短路从第二端子输出输入到第一端子的电压。

公开(公告)号：US07880470B2

公开(公告)日：2011-02-01

申请号：US12613322

申请日：2009-11-05

申请人： Seiji Amanuma

发明人： Seiji Amanuma

IPC分类号： G01R31/02 ,  G01R31/327

CPC分类号： H03K17/0412 ,  H03K17/04123 ,  H03K17/163 ,  H03K17/28 ,  H03K17/284 ,  H03K17/6871 ,  H03K17/6877 ,  Y10T307/747 ,  Y10T307/76 ,  Y10T307/964

摘要： A test apparatus for a device under test (DUT) that includes a signal output device that outputs a signal according to a test signal and a detecting section that detects a signal output from the DUT that outputs a detection result. The signal output device includes an output port, a high-voltage side switching circuit between a first terminal and a second terminal, a low-voltage side switching circuit between a first terminal and a second terminal, and a control section that outputs the first and second control signals. Each of the high-voltage and the low-voltage side switching circuits include a plurality of switching devices serially connected between the first and second terminals. The plurality of switching devices are opened substantially in synchronization with each other, such that a voltage inputted to the first terminal is outputted from the second terminal by short-circuiting between the first and second terminals.

摘要翻译： 一种被测设备（DUT）的测试装置，包括根据测试信号输出信号的信号输出装置和检测从输出检测结果的DUT输出的信号的检测部分。 信号输出装置包括输出端口，在第一端子和第二端子之间的高压侧开关电路，在第一端子和第二端子之间的低压侧开关电路，以及控制部分，其输出第一和第二端子 第二控制信号。 高压侧和低压侧切换电路中的每一个包括串联连接在第一和第二端子之间的多个开关装置。 多个开关装置基本上彼此同步地打开，使得通过第一和第二端子之间的短路从第二端子输出输入到第一端子的电压。