公开(公告)号：US08499217B2

公开(公告)日：2013-07-30

申请号：US12153121

申请日：2008-05-14

申请人： Seung-Hwan Song ,  Jun Jin Kong ,  Jae Hong Kim ,  Kyoung Lae Cho ,  Sung Chung Park

发明人： Seung-Hwan Song ,  Jun Jin Kong ,  Jae Hong Kim ,  Kyoung Lae Cho ,  Sung Chung Park

IPC分类号： H03M13/00 ,  G06F11/00 ,  G11C29/00

CPC分类号： G06F11/141 ,  G06F11/1012 ,  G06F11/1072 ,  G11C11/5642 ,  G11C16/10 ,  G11C29/00

摘要： Memory devices and/or error control codes (ECC) decoding methods may be provided. A memory device may include a memory cell array, and a decoder to perform hard decision decoding of first data read from the memory cell array by a first read scheme, and to generate output data and error information of the output data. The memory device may also include and a control unit to determine an error rate of the output data based on the error information, and to determine whether to transmit an additional read command for soft decision decoding to the memory cell array based on the error rate. An ECC decoding time may be reduced through such a memory device.

公开(公告)号：US08085599B2

公开(公告)日：2011-12-27

申请号：US12801505

申请日：2010-06-11

申请人： Kyoung Lae Cho ,  Seung-Hwan Song ,  Yoon Dong Park ,  Jun Jin Kong ,  Jae Hong Kim

发明人： Kyoung Lae Cho ,  Seung-Hwan Song ,  Yoon Dong Park ,  Jun Jin Kong ,  Jae Hong Kim

IPC分类号： G11C11/34

CPC分类号： G11C11/5628 ,  G11C16/32 ,  G11C16/349 ,  G11C29/00 ,  G11C2211/5634

摘要： Memory devices and/or methods that may estimate characteristics of multi-bit cell are provided. A memory device may include: a multi-bit cell array; a monitoring unit to extract a threshold voltage change over time value for reference threshold voltage states selected from a plurality of threshold voltage states corresponding to data stored in the multi-bit cell array; and an estimation unit to estimate a threshold voltage change over time values for the plurality of threshold voltage states based on the extracted threshold voltage change. Through this, it is possible to monitor a change over time of threshold voltages of a memory cell.

摘要翻译： 提供了可以估计多位单元特性的存储器件和/或方法。 存储器设备可以包括：多位单元阵列; 监测单元，用于提取从对应于存储在多位单元阵列中的数据的多个阈值电压状态中选择的参考阈值电压状态的时间值的阈值电压变化; 以及估计单元，用于基于所提取的阈值电压变化来估计所述多个阈值电压状态的时间值的阈值电压变化。 由此，可以监视存储单元的阈值电压随时间的变化。

公开(公告)号：US07929346B2

公开(公告)日：2011-04-19

申请号：US12216745

申请日：2008-07-10

申请人： Dong Hun Yu ,  Kyoung Lae Cho ,  Dong Hyuk Chae ,  Jun Jin Kong ,  Jae Hong Kim ,  Seung-Hwan Song

发明人： Dong Hun Yu ,  Kyoung Lae Cho ,  Dong Hyuk Chae ,  Jun Jin Kong ,  Jae Hong Kim ,  Seung-Hwan Song

IPC分类号： G11C16/06 ,  G11C16/34 ,  G11C16/26

CPC分类号： G11C7/1006 ,  G11C7/14 ,  G11C11/5642 ,  G11C29/00 ,  G11C29/028 ,  G11C29/42 ,  G11C29/50 ,  G11C2211/5634

摘要： Example embodiments may relate to a method and an apparatus for reading data stored in a memory, for example, providing a method and an apparatus for controlling a reference voltage based on an error of the stored data. Example embodiments may provide a memory data detecting apparatus including a first voltage comparator to compare a threshold voltage of a memory cell with a first reference voltage, a first data determiner to determine a value of at least one data bit stored in the memory cell according to a result of the comparison, an error verifier to verify whether an error occurs in the determined value, a reference voltage determiner to determine a second reference voltage that is lower than the first reference voltage based on a result of the verification, and a second data determiner to re-determine the value of the data based on the determined second reference voltage.

摘要翻译： 示例性实施例可以涉及用于读取存储在存储器中的数据的方法和装置，例如提供一种基于存储的数据的错误来控制参考电压的方法和装置。 示例性实施例可以提供一种存储器数据检测装置，其包括用于将存储器单元的阈值电压与第一参考电压进行比较的第一电压比较器，第一数据确定器，用于根据存储器单元存储的至少一个数据位的值，根据 比较结果，用于验证所确定的值是否发生错误验证器，基于验证结果确定低于第一参考电压的第二参考电压的参考电压确定器，以及第二数据 确定器，以基于所确定的第二参考电压重新确定数据的值。

公开(公告)号：US20100254195A1

公开(公告)日：2010-10-07

申请号：US12801505

申请日：2010-06-11

申请人： Kyoung Lae Cho ,  Seung-Hwan Song ,  Yoon Dong Park ,  Jun Jin Kong ,  Jae Hong Kim

发明人： Kyoung Lae Cho ,  Seung-Hwan Song ,  Yoon Dong Park ,  Jun Jin Kong ,  Jae Hong Kim

IPC分类号： G11C16/04

CPC分类号： G11C11/5628 ,  G11C16/32 ,  G11C16/349 ,  G11C29/00 ,  G11C2211/5634

摘要： Memory devices and/or methods that may estimate characteristics of multi-bit cell are provided. A memory device may include: a multi-bit cell array; a monitoring unit to extract a threshold voltage change over time value for reference threshold voltage states selected from a plurality of threshold voltage states corresponding to data stored in the multi-bit cell array; and an estimation unit to estimate a threshold voltage change over time values for the plurality of threshold voltage states based on the extracted threshold voltage change. Through this, it is possible to monitor a change over time of threshold voltages of a memory cell.

摘要翻译： 提供了可以估计多位单元特性的存储器件和/或方法。 存储器设备可以包括：多位单元阵列; 监测单元，用于提取从对应于存储在多位单元阵列中的数据的多个阈值电压状态中选择的参考阈值电压状态的时间值的阈值电压变化; 以及估计单元，用于基于所提取的阈值电压变化来估计所述多个阈值电压状态的时间值的阈值电压变化。 由此，可以监视存储单元的阈值电压随时间的变化。

公开(公告)号：US07738293B2

公开(公告)日：2010-06-15

申请号：US12213944

申请日：2008-06-26

申请人： Kyoung Lae Cho ,  Yoon Dong Park ,  Jun Jin Kong ,  Jong Han Kim ,  Jae Hong Kim ,  Young Hwan Lee ,  Heeseok Eun ,  Seung-Hwan Song

发明人： Kyoung Lae Cho ,  Yoon Dong Park ,  Jun Jin Kong ,  Jong Han Kim ,  Jae Hong Kim ,  Young Hwan Lee ,  Heeseok Eun ,  Seung-Hwan Song

IPC分类号： G11C16/04 ,  G11C29/04

CPC分类号： G11C11/5628 ,  G11C29/00 ,  G11C2216/14

摘要： A memory programming apparatuses and/or methods are provided. The memory programming apparatus may include a data storage unit, a first counting unit, an index storage unit and/or a programming unit. The data storage unit may be configured to store a data page. The first counting unit may be configured to generate index information by counting a number of cells included in at least one reference threshold voltage state based on the data page. The index storage unit may be configured to store the generated index information. The programming unit may be configured to store the data page in the data storage unit and store the generated index information in the index storage unit. The first counting unit may send the generated index information to the programming unit. The memory programming apparatus can monitor distribution states of threshold voltages in memory cells.

摘要翻译： 提供了存储器编程设备和/或方法。 存储器编程装置可以包括数据存储单元，第一计数单元，索引存储单元和/或编程单元。 数据存储单元可以被配置为存储数据页。 第一计数单元可以被配置为通过基于数据页计数包括在至少一个参考阈值电压状态中的单元的数量来生成索引信息。 索引存储单元可以被配置为存储所生成的索引信息。 编程单元可以被配置为将数据页存储在数据存储单元中，并将生成的索引信息存储在索引存储单元中。 第一计数单元可以将生成的索引信息发送到编程单元。 存储器编程装置可以监视存储器单元中阈值电压的分布状态。

公开(公告)号：US20090175076A1

公开(公告)日：2009-07-09

申请号：US12213657

申请日：2008-06-23

申请人： Kyoung Lae Cho ,  Seung-Hwan Song ,  Yoon Dong Park ,  Jun Jin Kong ,  Jae-Hong Kim

发明人： Kyoung Lae Cho ,  Seung-Hwan Song ,  Yoon Dong Park ,  Jun Jin Kong ,  Jae-Hong Kim

IPC分类号： G11C16/00 ,  G11C7/00

CPC分类号： G11C11/5628 ,  G11C16/32 ,  G11C16/349 ,  G11C29/00 ,  G11C2211/5634

摘要： Memory devices and/or methods that may estimate characteristics of multi-bit cell are provided. A memory device may include: a multi-bit cell array; a monitoring unit to extract a threshold voltage change over time value for reference threshold voltage states selected from a plurality of threshold voltage states corresponding to data stored in the multi-bit cell array; and an estimation unit to estimate a threshold voltage change over time values for the plurality of threshold voltage states based on the extracted threshold voltage change. Through this, it is possible to monitor a change over time of threshold voltages of a memory cell.

摘要翻译： 提供了可以估计多位单元特性的存储器件和/或方法。 存储器设备可以包括：多位单元阵列; 监测单元，用于提取从对应于存储在多位单元阵列中的数据的多个阈值电压状态中选择的参考阈值电压状态的时间值的阈值电压变化; 以及估计单元，用于基于所提取的阈值电压变化来估计所述多个阈值电压状态的时间值的阈值电压变化。 由此，可以监视存储单元的阈值电压随时间的变化。

公开(公告)号：US20090222701A1

公开(公告)日：2009-09-03

申请号：US12219103

申请日：2008-07-16

申请人： Seung-Hwan Song ,  Kyoung Lae Cho ,  Jun Jin Kong ,  Jae Hong Kim

发明人： Seung-Hwan Song ,  Kyoung Lae Cho ,  Jun Jin Kong ,  Jae Hong Kim

IPC分类号： G06F11/00 ,  G06F12/16

CPC分类号： G11C11/56 ,  G06F11/1012 ,  G11C29/00

摘要： Example embodiments relate to an apparatus which may determine a length of data to be stored in a memory cell, and may store the data in a memory based on the determined length. A memory data storage apparatus according to example embodiments may, include: a determination unit that may determine a number of bits of data and a number of bits of data detection information to be stored in a memory cell; a data receiving unit that may receive data corresponding to the determined number of bits; an error correction coding unit that may perform an error correction coding with respect to the received data and generate data detection information corresponding to the number of bits of the data detection information; and a data storage unit that may store the received data and generated data detection information in the memory cell.

摘要翻译： 示例性实施例涉及可以确定要存储在存储器单元中的数据的长度的装置，并且可以基于所确定的长度将数据存储在存储器中。 根据示例实施例的存储器数据存储装置可以包括：确定单元，其可以确定要存储在存储器单元中的数据的位数和数据检测信息的位数; 数据接收单元，其可以接收与所确定的位数相对应的数据; 纠错编码单元，其可以对所接收的数据执行纠错编码，并生成与数据检测信息的位数相对应的数据检测信息; 以及数据存储单元，其可以将所接收的数据和生成的数据检测信息存储在存储单元中。

公开(公告)号：US20090177931A1

公开(公告)日：2009-07-09

申请号：US12153121

申请日：2008-05-14

申请人： Seung-Hwan Song ,  Jun Jin Kong ,  Jae Hong Kim ,  Kyoung Lae Cho ,  Sung Chung Park

发明人： Seung-Hwan Song ,  Jun Jin Kong ,  Jae Hong Kim ,  Kyoung Lae Cho ,  Sung Chung Park

IPC分类号： G06F11/07 ,  G06F11/00

CPC分类号： G06F11/141 ,  G06F11/1012 ,  G06F11/1072 ,  G11C11/5642 ,  G11C16/10 ,  G11C29/00

摘要： Memory devices and/or error control codes (ECC) decoding methods may be provided. A memory device may include a memory cell array, and a decoder to perform hard decision decoding of first data read from the memory cell array by a first read scheme, and to generate output data and error information of the output data. The memory device may also include and a control unit to determine an error rate of the output data based on the error information, and to determine whether to transmit an additional read command for soft decision decoding to the memory cell array based on the error rate. An ECC decoding time may be reduced through such a memory device.

摘要翻译： 可以提供存储器件和/或错误控制代码（ECC）解码方法。 存储器件可以包括存储单元阵列和解码器，以通过第一读取方案对从存储器单元阵列读取的第一数据进行硬判决解码，并且生成输出数据和输出数据的输出数据和错误信息。 存储器装置还可以包括和控制单元，用于基于错误信息确定输出数据的错误率，并且基于错误率来确定是否向存储器单元阵列发送用于软判决解码的附加读命令。 可以通过这样的存储器件来减少ECC解码时间。

公开(公告)号：US08305818B2

公开(公告)日：2012-11-06

申请号：US13303353

申请日：2011-11-23

申请人： Kyoung Lae Cho ,  Seung-Hwan Song ,  Yoon Dong Park ,  Jun Jin Kong ,  Jae-Hong Kim

发明人： Kyoung Lae Cho ,  Seung-Hwan Song ,  Yoon Dong Park ,  Jun Jin Kong ,  Jae-Hong Kim

IPC分类号： G11C11/34

CPC分类号： G11C11/5628 ,  G11C16/32 ,  G11C16/349 ,  G11C29/00 ,  G11C2211/5634

摘要： Memory devices and/or methods that may estimate characteristics of multi-bit cell are provided. A memory device may include: a multi-bit cell array; a monitoring unit to extract a threshold voltage change over time value for reference threshold voltage states selected from a plurality of threshold voltage states corresponding to data stored in the multi-bit cell array; and an estimation unit to estimate a threshold voltage change over time values for the plurality of threshold voltage states based on the extracted threshold voltage change. Through this, it is possible to monitor a change over time of threshold voltages of a memory cell.

摘要翻译： 提供了可以估计多位单元特性的存储器件和/或方法。 存储器设备可以包括：多位单元阵列; 监测单元，用于提取从对应于存储在多位单元阵列中的数据的多个阈值电压状态中选择的参考阈值电压状态的时间值的阈值电压变化; 以及估计单元，用于基于所提取的阈值电压变化来估计所述多个阈值电压状态的时间值的阈值电压变化。 由此，可以监视存储单元的阈值电压随时间的变化。

公开(公告)号：US20120069654A1

公开(公告)日：2012-03-22

申请号：US13303353

申请日：2011-11-23

申请人： Kyoung Lae CHO ,  Seung-Hwan Song ,  Yoong Dong Park ,  Jun Jin Kong ,  Jae Hong Kim

发明人： Kyoung Lae CHO ,  Seung-Hwan Song ,  Yoong Dong Park ,  Jun Jin Kong ,  Jae Hong Kim

IPC分类号： G11C16/04

CPC分类号： G11C11/5628 ,  G11C16/32 ,  G11C16/349 ,  G11C29/00 ,  G11C2211/5634

摘要： Memory devices and/or methods that may estimate characteristics of multi-bit cell are provided. A memory device may include: a multi-bit cell array; a monitoring unit to extract a threshold voltage change over time value for reference threshold voltage states selected from a plurality of threshold voltage states corresponding to data stored in the multi-bit cell array; and an estimation unit to estimate a threshold voltage change over time values for the plurality of threshold voltage states based on the extracted threshold voltage change. Through this, it is possible to monitor a change over time of threshold voltages of a memory cell.

摘要翻译： 提供了可以估计多位单元特性的存储器件和/或方法。 存储器设备可以包括：多位单元阵列; 监测单元，用于提取从对应于存储在多位单元阵列中的数据的多个阈值电压状态中选择的参考阈值电压状态的时间值的阈值电压变化; 以及估计单元，用于基于所提取的阈值电压变化来估计所述多个阈值电压状态的时间值的阈值电压变化。 由此，可以监视存储单元的阈值电压随时间的变化。