公开(公告)号：US20200056942A1

公开(公告)日：2020-02-20

申请号：US16103238

申请日：2018-08-14

Applicant: SHIMADZU CORPORATION

Inventor： Atsushi UEDA

IPC: G01J3/453 ,  G02B21/00 ,  G01J3/28 ,  G01J3/02

Abstract: An infrared microscope includes an illumination optical system which guides infrared red to an analysis position on a sample; a connection optical system which guides infrared light, supplied from an infrared spectrophotometer, to said illumination optical system; a visible light source unit which outputs visible light to a region including said analysis position on the sample; an image acquisition unit which inputs visible light from the region including said analysis position on the sample to a detection surface and acquires a visible light image; and a detection unit which detects infrared light from said analysis position on the sample. The connection optical system can be positionally adjusted, and said image acquisition unit is capable of acquiring an infrared light image by inputting infrared light to a detection surface.

公开(公告)号：US20180143417A1

公开(公告)日：2018-05-24

申请号：US15580477

申请日：2015-06-11

Applicant: Shimadzu Corporation

Inventor： Atsushi UEDA

IPC: G02B21/04 ,  G02B7/198

CPC classification number: G02B21/04 ,  G02B7/182 ,  G02B7/1822 ,  G02B7/198 ,  G02B17/061 ,  G02B21/06 ,  G02B21/08

Abstract: This Cassegrain reflector 200 is provided with a primary mirror 201 and a secondary mirror 202 disposed coaxially with the primary mirror 201 and laterally supported by a plurality of supporting rods. The Cassegrain reflector 200 causes the light incident through an opening 212 formed along an axial line L of the primary mirror 201 to be reflected onto the secondary mirror 202, and then causes the light to be reflected onto the primary mirror 201 in order to emit the light toward a measurement position through an opening 231 formed on the side of the secondary mirror 202. A Cassegrain reflector retention mechanism 6 for retaining the Cassegrain reflector 200 is provided with a retainer 61 for retaining the Cassegrain reflector 200, and a rotation adjustment mechanism 60 for adjusting the rotational position of the plurality of supporting rods.

公开(公告)号：US20180024344A1

公开(公告)日：2018-01-25

申请号：US15549276

申请日：2015-02-17

Applicant: Shimadzu Corporation

Inventor： Atsushi UEDA

IPC: G02B21/36 ,  G02B21/24 ,  G02B21/06

CPC classification number: G02B21/362 ,  G02B17/061 ,  G02B21/04 ,  G02B21/06 ,  G02B21/082 ,  G02B21/18 ,  G02B21/248 ,  G02B21/361 ,  H04N5/2256

Abstract: A microscope equipped with an imaging device used for the positioning of a sample, the microscope capable of removing distortion and blind spots from an image generated by the imaging device and reducing cost by using a commercially available imaging device. A sample holder for holding a sample; a measurement light source for irradiating the sample held by the sample holder with irradiation light; a focusing optical element for focusing measurement light derived from the irradiation light transmitted through or reflected from the sample; a detection unit for detecting the measurement light focused by the focusing optical element; an image capture device for capturing the image of the sample; and an objective optical system switching unit arranged to switch either the focusing optical element or the image capture device with the other to a position facing the sample.

公开(公告)号：US20170371139A1

公开(公告)日：2017-12-28

申请号：US15539706

申请日：2015-01-05

Applicant: Shimadzu Corporation

Inventor： Atsushi UEDA

IPC: G02B21/04 ,  G01N21/35 ,  G01N21/552 ,  G02B7/18

CPC classification number: G02B21/04 ,  G01N21/35 ,  G01N21/3577 ,  G01N21/552 ,  G01N2201/0636 ,  G01N2201/0638 ,  G01N2201/064 ,  G02B7/1805 ,  G02B21/26

Abstract: An objective optical system includes a convex secondary mirror configured to reflect a measurement light irradiated from an infrared microscope, a concave primary mirror configured to reflect the measurement light reflected by the secondary mirror, a prism to which the measurement light reflected by the primary mirror is irradiated, and a light shielding means provided on an optical path of the measurement light between the primary mirror and the prism to shield a part of the light beam of the measurement light.